Application of nonlinear methods in tracking failure test of epoxy/SiO 2 nanocomposite

Proceedings of the 2010 IEEE International Conference on Solid Dielectrics, ICSD 2010

Volumn , Issue , 2010, Pages

  Du, B X ^a   Zhang, J W ^a   Gu, L ^a   Liu, H J ^a  

^a TIANJIN UNIVERSITY   (China)

Author keywords

Epoxy; Fractal dimension; Image processing; Nanocomposite; Recurrence plot; SiO2; Tracking pattern

Indexed keywords

AC VOLTAGE; DISCHARGE CURRENTS; EPOXY; INSULATION DISTANCES; NANO SCALE; NON-LINEAR METHODS; PLATE ELECTRODES; RECURRENCE PLOT; RESISTANCE TO TRACKING; SIO2; TEST SAMPLES; TRACKING FAILURE; TRACKING PATTERN; WEIGHT RATIOS;

CARBONIZATION; IMAGE PROCESSING; IMAGING SYSTEMS; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; NANOTECHNOLOGY; PARTIAL DISCHARGES; SILICON COMPOUNDS;

FRACTAL DIMENSION;

EID: 77958062852     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSD.2010.5568100     Document Type: Conference Paper

References (7)

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7. B. X. Du, L. Gu, D. S. Dong and X. L. Zheng, "Recurrent plot analysis of discharge sequences in tracking test of polybutylene polymers", J. Phys. D: Appl. Phys., Vol.41, No.19, 195412 (7pp), 2008.