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Volumn 82, Issue 20, 2010, Pages 8398-8401

Heat-associated field distortion in electro-migration techniques

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL SCIENCE; FIELD DISTORTIONS; FIELD STRENGTHS; HEAT DISSIPATION; IN-FIELD; MIGRATION TECHNIQUE; NONUNIFORM; POTENTIAL SOURCES;

EID: 77958031110     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac102018m     Document Type: Article
Times cited : (9)

References (15)
  • 14
    • 0001916285 scopus 로고    scopus 로고
    • Kok, W. Chromatographia 2000, 51 (Suppl.) S24-27
    • (2000) Chromatographia , vol.51 , Issue.SUPPL. , pp. 24-27
    • Kok, W.1
  • 15
    • 77958044344 scopus 로고    scopus 로고
    • Polymicro Technologies. Phoenix, AZ
    • Polymicro Technologies. Phoenix, AZ, www.polymicro.com/catalogA-6.htm, 2005.
    • (2005)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.