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Volumn 97, Issue 14, 2010, Pages

Acoustics at nanoscale: Raman-Brillouin scattering from thin silicon-on-insulator layers

Author keywords

[No Author keywords available]

Indexed keywords

BRILLOUIN; CHEMICAL TREATMENTS; NANO SCALE; PHOTOELASTIC MODELS; SILICON LAYER; SILICON ON INSULATOR; SILICON-ON-INSULATOR STRUCTURE; SPECTRAL RESPONSE; SUBNANOMETERS; THICK OXIDES;

EID: 77958026604     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3499309     Document Type: Article
Times cited : (9)

References (9)
  • 1
    • 20844439688 scopus 로고    scopus 로고
    • A different way of performing picosecond ultrasonic measurements in thin transparent films based on laser-wavelength effects
    • DOI 10.1063/1.1929869, 211903
    • A. Devos, R. Côte, G. Caruyer, and A. Lef̀vre, Appl. Phys. Lett. APPLAB 0003-6951 86, 211903 (2005), and references therein. 10.1063/1.1929869 (Pubitemid 40861504)
    • (2005) Applied Physics Letters , vol.86 , Issue.21 , pp. 1-3
    • Devos, A.1    Cote, R.2    Caruyer, G.3    Lefvre, A.4
  • 5
    • 79956057138 scopus 로고    scopus 로고
    • Probing confined interfacial excitations in buried layers by Brillouin light scattering
    • DOI 10.1063/1.1484550
    • X. Zhang and R. Sooryakumar, Appl. Phys. Lett. APPLAB 0003-6951 80, 4501 (2002). 10.1063/1.1484550 (Pubitemid 34751386)
    • (2002) Applied Physics Letters , vol.80 , Issue.24 , pp. 4501
    • Zhang, X.1    Sooryakumar, R.2
  • 6
    • 9144221026 scopus 로고    scopus 로고
    • PLRBAQ 0556-2805, (), and references therein. 10.1103/PhysRevB.67.075407
    • X. Zhang, R. S. Bandhu, R. Sooryakumar, and B. T. Jonker, Phys. Rev. B PLRBAQ 0556-2805 67, 075407 (2003), and references therein. 10.1103/PhysRevB.67. 075407
    • (2003) Phys. Rev. B , vol.67 , pp. 075407
    • Zhang, X.1    Bandhu, R.S.2    Sooryakumar, R.3    Jonker, B.T.4
  • 9
    • 77958032523 scopus 로고
    • 2nd ed. (McGraw-Hill, Boston), Cha
    • L. E. Katz, VLSE Technology, 2nd ed. (McGraw-Hill, Boston, 1988), Chap., pp. 98-140.
    • (1988) VLSE Technology , pp. 98-140
    • Katz, L.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.