Probing structure and microstructure of epitaxial Ni-Mn-Ga films by reciprocal space mapping and pole figure measurements

Acta Materialia

Volumn 58, Issue 20, 2010, Pages 6665-6671

  Ge, Y ^a   Heczko, O ^b   Hannula, S P ^a   Fahler S ^c  

^a AALTO UNIVERSITY   (Finland)

^b INSTITUTE OF PHYSICS   (Czech Republic)

^c IFW DRESDEN   (Germany)

Author keywords

Ni Mn Ga; Reciprocal space mapping; Thin film

Indexed keywords

AUSTENITE PHASE; EPITAXIALLY GROWN; INTERMEDIATE LAYERS; INTERMEDIATE PHASE; MARTENSITE PHASE; MARTENSITE STRUCTURES; MARTENSITIC TRANSFORMATION TEMPERATURES; MGO SUBSTRATE; NI-MN-GA; ORIENTATION DISTRIBUTIONS; ORTHORHOMBIC DISTORTION; POLE FIGURE MEASUREMENTS; RECIPROCAL SPACE MAPPING; RESIDUAL AUSTENITE; ROOM TEMPERATURE;

AUSTENITE; CRYSTAL MICROSTRUCTURE; EPITAXIAL FILMS; GALLIUM; GALLIUM ALLOYS; MANGANESE COMPOUNDS; MAPPING; MARTENSITE; MARTENSITIC TRANSFORMATIONS; PHASE INTERFACES; POLES; SUBSTRATES; TWINNING; X RAY DIFFRACTION;

MANGANESE;

EID: 77957998123     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2010.08.029     Document Type: Article

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