Using SIFT features in palmprint authentication

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2008, Pages

  Chen, Jiansheng ^a   Moon, Yiu Sang ^a  

^a CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

KEYPOINTS; LINE FEATURES; LOW RESOLUTION IMAGES; PALM-PRINT IMAGE; PALMPRINT AUTHENTICATION; PALMPRINTS; SCALE INVARIANT; SIFT FEATURE; STATE-OF-THE-ART ALGORITHMS;

AUTHENTICATION; BIOMETRICS; IMAGE PROCESSING; TIME SERIES;

ANTHROPOMETRY;

EID: 77957966905     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (17)

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