π-SIFT: A photometric and scale invariant feature transform

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2008, Pages

  Park, Jae Han ^a   Park, Kyung Wook ^a   Baeg, Seung Ho ^a   Baeg, Moon Hong ^a  

^a Korea Institute of Industrial Technology   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COLOR INFORMATION; DESCRIPTORS; DICHROMATIC REFLECTION MODEL; GEOMETRIC CHANGES; ILLUMINATION CHANGES; LOCAL DESCRIPTORS; PHOTOMETRIC INVARIANCE; PHOTOMETRIC VARIATIONS; SCALE INVARIANT FEATURE TRANSFORMS;

PATTERN RECOGNITION;

PHOTOMETRY;

EID: 77957961633     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)

1. D. G. Lowe. Distinctive image features from scaleinvariant keypoints. Int. J. Computer Vision, 60(2):91-110, 2004.
2. H. Bay, T. Tuytelaars, and L. V. Gool. SURF: Speeded up robust features. In Proc. ECCV 2006.
3. A. E. Abdel-Hakim and A. A. Farag. CSIFT: A SIFT descriptor with color invariant characteristics. In Proc. CVPR, pages 1978-1983, 2006.
4. J. van de Weijer, T. Gevers, and J. M. Geusebroek. Edge and corner detection by photometric quasi-invariants, IEEE Trans. Pattern Analysis and Machine Intelligence, 27(4):625-630, April 2005.
5. S. A. Shafer. Using color to separate reflection components. Color Res. Appl., 10(4):210-218, 1985.
6. K. Mikolajczyk and C. Schmid. A performance evaluation of local descriptors. In Proceedings of CVPR, pages 257-263, June 2003.
7. J. M. Geusebroek, R. van den Boomgaard, A. W. M. Smeulders, and H. Geerts. Color invariance. IEEE Trans. Pattern Analysis and Machine Intelligence, 23(12):1338-1350, 2001.