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Volumn 172, Issue 2, 2010, Pages 159-
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Focal issue on hybrid imaging
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CRYOELECTRON MICROSCOPY;
EDITORIAL;
HIPPOCAMPUS;
IMAGING;
MASS SPECTROMETRY;
MICROSCOPY;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
FROZEN SECTIONS;
MASS SPECTROMETRY;
MICROSCOPY, ATOMIC FORCE;
MICROSCOPY, ELECTRON;
MICROSCOPY, FLUORESCENCE;
MULTIPROTEIN COMPLEXES;
SYNAPSES;
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EID: 77957941761
PISSN: 10478477
EISSN: 10958657
Source Type: Journal
DOI: 10.1016/j.jsb.2010.09.014 Document Type: Editorial |
Times cited : (3)
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References (0)
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