A novel validity measure for clusters of arbitrary shapes and densities

Proceedings - International Conference on Pattern Recognition

Volumn , Issue , 2008, Pages

  Yousri, Noha A ^a,b   Kamel, Mohamed S ^a   Ismail, Mohamed A ^b  

^a UNIVERSITY OF WATERLOO   (Canada)

^b Alexandria University The Faculty Of Engineering   (Egypt)

Author keywords

[No Author keywords available]

Indexed keywords

PATTERN RECOGNITION;

ARBITRARY SHAPE; CENTER-BASED; DENSITY-BASED; DIFFERENT DENSITIES; NEIGHBOURHOOD; VALIDITY INDEX;

CLUSTERING ALGORITHMS;

EID: 77957935779     PISSN: 10514651     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/icpr.2008.4761242     Document Type: Conference Paper

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