Real-time two-dimensional imaging of potassium ion distribution using an ion semiconductor sensor with charged coupled device technology

Analytical Sciences

Volumn 26, Issue 10, 2010, Pages 1039-1045

  Hattori, Toshiaki ^a,b   Masaki, Yoshitomo ^a   Atsumi, Kazuya ^a   Kato, Ryo ^a   Sawada, Kazuaki ^a,b  

^a TOYOHASHI UNIVERSITY OF TECHNOLOGY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; CHLORINE COMPOUNDS; ION SELECTIVE MEMBRANES; IONS; MOS DEVICES; OXIDE SEMICONDUCTORS; PIXELS; POLYVINYL CHLORIDES; POTASSIUM; POTASSIUM CHLORIDE; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SILVER COMPOUNDS;

METAL OXIDE-SEMICONDUCTOR TECHNOLOGIES; POLYHEDRAL OLIGOMERIC SILSESQUIOXANES; REAL TIME OBSERVATION; REFERENCE ELECTRODES; SELECTIVITY COEFFICIENT; SEMI-CONDUCTOR SURFACES; SEMICONDUCTOR SENSORS; TWO-DIMENSIONAL IMAGING;

POTASSIUM COMPOUNDS;

EID: 77957930397     PISSN: 09106340     EISSN: 13482246     Source Type: Journal    
DOI: 10.2116/analsci.26.1039     Document Type: Article

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