A structured approach to process improvement in manufacturing systems

Production Planning and Control

Volumn 21, Issue 7, 2010, Pages 695-717

  Mauri, Federico ^a   Garetti, Marco ^a   Gandelli, Alessandro ^a  

^a POLITECNICO DI MILANO   (Italy)

Author keywords

efficiency improvement; lean; operations performance improvement; TPM; variability reduction

Indexed keywords

EFFICIENCY IMPROVEMENT; LEAN; PERFORMANCE IMPROVEMENTS; TPM; VARIABILITY REDUCTION;

COMPUTER OPERATING SYSTEMS; EFFICIENCY; PRODUCTIVITY;

MANUFACTURE;

EID: 77957929999     PISSN: 09537287     EISSN: 13665871     Source Type: Journal    
DOI: 10.1080/09537280903563485     Document Type: Article

References (12)

1. Delp, D. S., Hwang, J., and Pei, Y., 2003. A dynamic system regulation measure for increasing effective capacity: the X-factor theory. IEEE/SEMI advanced semiconductor manufacturing conference, 31 March-1 April 2003, INSPEC accession number 7726199, 81-88. ISSN 1078-8743, ISBN 0-7803-7673-0.
2. Gokul, R. C., et al., 2007. A methodology for measuring, reporting, navigating, and analyzing overall equipment productivity (OEP). IEEE/SEMI advanced semiconductor manufacturing conference, 11-12 June 2007, INSPEC accession number 9881746. doi: 10.1109/ASMC.2007. 375055, 306-312. ISBN 1-4244-0652-8.
3. Grando, A. and Turco, F., 2005. Modelling plant capacity and productivity: conceptual framework in a single-machine case. Production Planning & Control, 16, 309-322. (Pubitemid 43203753)
4. Hopp, W. J. and Spearman, M. L., 2001. Factory physics: foundation of manufacturing management. New York: McGraw Hill.
5. Jacobs, J. H. et al., 2003. Characterization of operational time variability using effective process times. IEEE Transactions on Semiconductor Manufacturing, 16, 511-520.
6. Productivity Press, 2005. TPM: collected practices and cases (insights on implementation), ISBN 1563273254.
7. Ron, A. J. and Rooda, J. E., 2005. Equipment effectiveness: OEE revisited. IEEE Transactions on Semiconductor Manufacturing, 18, 190-196.
8. Rother, M. and Shook, J., 2006. Learning to see. Cambridge, MA: Lean Enterprise Academy.
9. Stein, R. E., 2003. In: E. G. Schilling, ed. The theory of constraints. Rochester, New York: Rochester Institute of Technology.
10. Tolio, T., Matta, A., and Gershwin, S. B., 2002. Analysis of two-machine line with multiple failures modes. IIE Transactions, 34, 51-62. (Pubitemid 34138158)
11. Womack, J. P. and Jones, D. T., 2003. Lean thinking. London: Simon & Shuster.
12. Wu, K., 2007. An examination of variability and its basic properties for a factory. IEEE Transactions on Semiconductor Manufacturing, 18, 214-221.