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Volumn 17, Issue 5, 2010, Pages 1373-1377

Evaluation analysis of thermal ageing in insulation systems of electrical machines - A historical review - A h

Author keywords

[No Author keywords available]

Indexed keywords

ARRHENIUS; BASIC PRINCIPLES; ELECTRIC MACHINES; ELECTRICAL MACHINE; FUNCTIONAL EVALUATION; HISTORICAL REVIEW; IEEE STANDARDS; INSULATION SYSTEM; REFERENCE SYSTEMS; THERMAL AGEING; WINDING INSULATION;

EID: 77957917963     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2010.5595538     Document Type: Article
Times cited : (23)

References (23)
  • 1
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    • V. M. Montsinger, "Loading Transformers by temperature", AIEE-Trans. Vol. 49, pp. 776-790, 1930.
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    • Montsinger, V.M.1
  • 3
    • 84935408604 scopus 로고
    • Electrical insulation deterioration treated as a chemical rate phenomenon
    • T. W. Dakin, "Electrical Insulation Deterioration Treated as a Chemical Rate Phenomenon" AIEE-Trans. 67 Vol. 49, pp. 113-122, 1948.
    • (1948) AIEE-Trans. 67 , vol.49 , pp. 113-122
    • Dakin, T.W.1
  • 12
    • 77957897468 scopus 로고
    • Zur Beurteilung des Verhaltens der Wicklungsisolierung von Eberhardt, M.; Niederspannungs-Asynchronmaschinen, Berthold
    • Berlin
    • G. Börner, Zur Beurteilung des Verhaltens der Wicklungsisolierung von Eberhardt, M.; Niederspannungs-Asynchronmaschinen, Berthold, V. ELEKTRIE, Berlin, 40, 8, pp. 295-298, 1986.
    • (1986) V. Elektrie , vol.40 , Issue.8 , pp. 295-298
    • Börner, G.1
  • 14
    • 0036505951 scopus 로고    scopus 로고
    • Interface phenomena in stator winding insulation-Challenges in design, diagnosis, and service experience
    • DOI 10.1109/57.995396
    • M. Kaufhold, K. Schäfer, K. Bauer, A. Bethge and J. Risse", Interface Phenomena in Stator Winding Insulations: Challenges, Design, Diagnosis and Service Experience", IEEE Mag. Electr. Insul., Vol. 18, No. 2, pp. 27-36, 2002. (Pubitemid 34515319)
    • (2002) IEEE Electrical Insulation Magazine , vol.18 , Issue.2 , pp. 27-36
    • Kaufhold, M.1    Schafer, K.2    Bauer, K.3    Bethge, A.4    Risse, J.5
  • 15
    • 27144453040 scopus 로고    scopus 로고
    • Partial discharge and dissipation factor behavior of model insulating systems for high voltage rotating machines under different stresses
    • DOI 10.1109/MEI.2005.1513425
    • M. Farahani, H. Borsi, E. Gockenbach, and M. Kaufhold, "Partial discharge and dissipation factor behaviour of model insulating systems for high voltage rotating machines under different stresses", IEEE Electr. Insul. Mag., Vol. 21, No. 5, pages 5-18, 2005 (Pubitemid 41498697)
    • (2005) IEEE Electrical Insulation Magazine , vol.21 , Issue.5 , pp. 5-18
    • Farahani, M.1    Borsi, H.2    Gockenbach, E.3    Kaufhold, M.4
  • 17
    • 77957923842 scopus 로고
    • Bewertung der Isolierungssysteme von Niederspannungs-Asynchron-Maschinen
    • VEM-Antriebstechnik AG Dresden
    • V. Berthold, "Bewertung der Isolierungssysteme von Niederspannungs-Asynchron-Maschinen" Technische Mitteilungen 2/1990, VEM-Antriebstechnik AG Dresden, pp. 22-24
    • (1990) Technische Mitteilungen , vol.2 , pp. 22-24
    • Berthold, V.1
  • 20
    • 0030247001 scopus 로고    scopus 로고
    • Failure mechanism of the interturn insulation of low voltage electric machines fed by pulse-controlled inverters
    • M. Kaufhold, G. Börner, M. Eberhardt and J. Speck, "Failure mechanism of the interturn insulation of low voltage electric machines fed by pulse-controlled inverters", IEEE Electr. Insul. Mag., Vol. 12, No. 5, pp. 9-6, 1996 (Pubitemid 126541648)
    • (1996) IEEE Electrical Insulation Magazine , vol.12 , Issue.5 , pp. 9-16
    • Kaufhold, M.1    Borner, G.2    Eberhardt, M.3    Speck, J.4
  • 22
    • 69249174459 scopus 로고    scopus 로고
    • Reliability and statistical life time prognosis of motor winding insulations in low voltage power drive systems
    • M. Kaufhold, K. Bauer, F. Schemmel and K. Schäfer, "Reliability and statistical Life Time Prognosis of Motor Winding Insulations in Low Voltage Power Drive Systems", IEEE Electr. Insul. Mag., Vol. 25, No. 4, 2009.
    • (2009) IEEE Electr. Insul. Mag. , vol.25 , Issue.4
    • Kaufhold, M.1    Bauer, K.2    Schemmel, F.3    Schäfer, K.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.