Short-term breakdown and long-term failure in nanodielectrics: A review

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 17, Issue 5, 2010, Pages 1523-1535

  Li, Shengtao ^a   Yin, Guilai ^a   Chen, G ^b   Li, Jianying ^a   Bai, Suna ^a   Zhong, Lisheng ^a   Zhang, Yunxa ^a   Lei, Qingquan ^a,c  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b UNIVERSITY OF SOUTHAMPTON   (United Kingdom)

^c HARBIN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

Author keywords

cohesive energy density; long term degradation; Nanodielectric; short term breakdown

Indexed keywords

AGEING RESISTANCE; APPLIED VOLTAGES; BREAKDOWN PROPERTY; COHESIVE ENERGY DENSITY; DIELECTRIC CONSTANTS; EXPERIMENTAL DATA; FAILURE PROPERTIES; LONG TERM PERFORMANCE; LONG-TERM DEGRADATION; MATRIX; MICRO-COMPOSITES; NANO-FILLERS; NANODIELECTRIC; NANODIELECTRICS; POSITIVE EFFECTS; POTENTIAL BENEFITS; SHORT-TERM BREAKDOWN; WAVE FORMS;

DEGRADATION; DIELECTRIC MATERIALS; DOPING (ADDITIVES); NANOCOMPOSITES; NANOPARTICLES; PARTIAL DISCHARGES; POLYMER MATRIX;

ELECTRIC PROPERTIES;

EID: 77957914606     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2010.5595554     Document Type: Article

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