What is measured in the scanning gate microscopy of a quantum point contact?

Physical Review Letters

Volumn 105, Issue 16, 2010, Pages

  Jalabert, Rodolfo A ^a   Szewc, Wojciech ^a   Tomsovic, Steven ^b,c   Weinmann, Dietmar ^a  

^a INSTITUT DE PHYSIQUE ET CHIMIE DES MATÉRIAUX DE STRASBOURG   (France)

^b INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^c WASHINGTON STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FIRST-ORDER; GENERAL EXPRESSION; LOCAL PERTURBATION; PHASE COHERENT; QUANTUM POINT CONTACT; SCANNING GATE MICROSCOPY; SCATTERING STATE; SECOND ORDERS; SPATIAL DECAY;

ELECTRON GAS; POINT CONTACTS; QUANTUM CHEMISTRY;

TWO DIMENSIONAL ELECTRON GAS;

EID: 77957910601     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.166802     Document Type: Article

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