-
2
-
-
0035891138
-
-
Gratzel M. Nature 2001, 414:338.
-
(2001)
Nature
, vol.414
, pp. 338
-
-
Gratzel, M.1
-
4
-
-
37349055104
-
-
Chu D., Yuan X., Qin G., Xu M., Zheng P., Lu J., Zha L. J. Nanopart. Res. 2008, 10:357.
-
(2008)
J. Nanopart. Res.
, vol.10
, pp. 357
-
-
Chu, D.1
Yuan, X.2
Qin, G.3
Xu, M.4
Zheng, P.5
Lu, J.6
Zha, L.7
-
5
-
-
2342503731
-
-
Ohno T., Akiyoshi M., Umebayashi T., Asai T., Mitsui T., Matsumura M. Appl. Catal. A 2004, 265:115.
-
(2004)
Appl. Catal. A
, vol.265
, pp. 115
-
-
Ohno, T.1
Akiyoshi, M.2
Umebayashi, T.3
Asai, T.4
Mitsui, T.5
Matsumura, M.6
-
6
-
-
2542471329
-
-
Torres G.R., Lindgren T., Lu J., Granqvist C.G., Lindquist S.E. J. Phys. Chem. B 2004, 108:5995.
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 5995
-
-
Torres, G.R.1
Lindgren, T.2
Lu, J.3
Granqvist, C.G.4
Lindquist, S.E.5
-
8
-
-
34250685073
-
-
Kuang D., Klein C., Ito S., Moser J.E., Humphry-Baker R., Evans N., Duriaux F., Grätzel C., Zakeeruddin S.M., Grätzel M. Adv. Mater. 2007, 19:1133.
-
(2007)
Adv. Mater.
, vol.19
, pp. 1133
-
-
Kuang, D.1
Klein, C.2
Ito, S.3
Moser, J.E.4
Humphry-Baker, R.5
Evans, N.6
Duriaux, F.7
Grätzel, C.8
Zakeeruddin, S.M.9
Grätzel, M.10
-
9
-
-
33846709118
-
-
Wang Q., Ito S., Grätzel M., Fabregat-Santiago F., Mora-Seró I., Bisquert J., Bessho T., Imai H. J. Phys. Chem. B 2006, 110:25210.
-
(2006)
J. Phys. Chem. B
, vol.110
, pp. 25210
-
-
Wang, Q.1
Ito, S.2
Grätzel, M.3
Fabregat-Santiago, F.4
Mora-Seró, I.5
Bisquert, J.6
Bessho, T.7
Imai, H.8
-
10
-
-
33847609593
-
-
Chen W., Sun X., Cai Q., Weng D., Li H. Electrochem. Commun. 2007, 9:382.
-
(2007)
Electrochem. Commun.
, vol.9
, pp. 382
-
-
Chen, W.1
Sun, X.2
Cai, Q.3
Weng, D.4
Li, H.5
-
11
-
-
25844503685
-
-
Zukalov M., Zukal A., Kavan L., Nazeeruddin M.K., Liska P., Grtzel M. Nano Lett. 2005, 5:1789.
-
(2005)
Nano Lett.
, vol.5
, pp. 1789
-
-
Zukalov, M.1
Zukal, A.2
Kavan, L.3
Nazeeruddin, M.K.4
Liska, P.5
Grtzel, M.6
-
12
-
-
67649151227
-
-
Chen D., Huang F., Cheng Y.B., Caruso R.A. Adv. Mater. 2009, 21:1.
-
(2009)
Adv. Mater.
, vol.21
, pp. 1
-
-
Chen, D.1
Huang, F.2
Cheng, Y.B.3
Caruso, R.A.4
-
15
-
-
27744511291
-
-
Wanga C., Xu B.Q., Wang X., Zhao X.J. J. Solid State Chem. 2005, 178:3500.
-
(2005)
J. Solid State Chem.
, vol.178
, pp. 3500
-
-
Wanga, C.1
Xu, B.Q.2
Wang, X.3
Zhao, X.J.4
-
16
-
-
77955292831
-
-
Chae J., Lee J., Jeong H., Kang M. Bull. Korean Chem. Soc. 2009, 30:302.
-
(2009)
Bull. Korean Chem. Soc.
, vol.30
, pp. 302
-
-
Chae, J.1
Lee, J.2
Jeong, H.3
Kang, M.4
-
22
-
-
0344961261
-
-
Lee B.Y., Park S.H., Lee S.C., Kang M., Park C.H., Choung S.J. J. Ind. Eng. Chem. 2003, 20:812.
-
(2003)
J. Ind. Eng. Chem.
, vol.20
, pp. 812
-
-
Lee, B.Y.1
Park, S.H.2
Lee, S.C.3
Kang, M.4
Park, C.H.5
Choung, S.J.6
-
23
-
-
41549088109
-
-
Veeco Instruments Inc.
-
Serry F.M., Kjoller K., Thornton J.T., Tench R.J., Cook D. Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope 2007, Veeco Instruments Inc.
-
(2007)
Electric Force Microscopy, Surface Potential Imaging, and Surface Electric Modification with the Atomic Force Microscope
-
-
Serry, F.M.1
Kjoller, K.2
Thornton, J.T.3
Tench, R.J.4
Cook, D.5
-
24
-
-
77954860117
-
-
Plenum Press, New York, Czanderna (Ed.)
-
Vorburger T.V., Dagata J.A., Wilkening G., Lizuka K. Characterization of Surface Topography, Beam Effects, and Depth Profiling in Surface Analysis 1998, Plenum Press, New York. Czanderna (Ed.).
-
(1998)
Characterization of Surface Topography, Beam Effects, and Depth Profiling in Surface Analysis
-
-
Vorburger, T.V.1
Dagata, J.A.2
Wilkening, G.3
Lizuka, K.4
-
25
-
-
34247101814
-
-
Sun H.T., Li Z., Zhou J., Zhao Y.Y., Lu M. Appl. Surf. Sci. 2007, 253:6109.
-
(2007)
Appl. Surf. Sci.
, vol.253
, pp. 6109
-
-
Sun, H.T.1
Li, Z.2
Zhou, J.3
Zhao, Y.Y.4
Lu, M.5
|