Estimation of presampling modulation transfer function in synchrotron radiation microtomography

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 621, Issue 1-3, 2010, Pages 615-619

  Mizutani, Ryuta ^a   Taguchi, Keisuke ^a   Takeuchi, Akihisa ^b   Uesugi, Kentaro ^b   Suzuki, Yoshio ^b  

^a TOKAI UNIVERSITY   (Japan)

^b Institute of Physical and Chemical Research   (Japan)

Author keywords

Focused ion beam milling; Line spread function; Micro CT; Test pattern

Indexed keywords

ALUMINUM SURFACE; ALUMINUM WIRES; ARBITRARY ORIENTATION; DIAMOND CRYSTALS; FLAT SURFACES; FOCUSED ION BEAM MILLING; HIGH-PRECISION; LINE SPREAD FUNCTIONS; MATRIX; MICRO CT; MICROMETER SCALE; MODULATION TRANSFER FUNCTION; NANOMETER ROUGHNESS; SLANTED-EDGE METHOD; SPATIAL RESOLUTION; SQUARE-WAVE; STEP-RESPONSE FUNCTIONS; SYNCHROTRON RADIATION MICROTOMOGRAPHY; TEST PATTERN; X-RAY REFRACTION;

ALUMINUM; COMPUTERIZED TOMOGRAPHY; ION BEAMS; IONS; MILLING (MACHINING); OPTICAL TRANSFER FUNCTION; SPEED CONTROL; SYNCHROTRON RADIATION; SYNCHROTRONS; WIRE;

TRANSFER FUNCTIONS;

EID: 77957898680     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.03.111     Document Type: Article

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