Controlled fabrication of SnO2 arrays of well-aligned nanotubes and nanowires

Nanoscale

Volumn 2, Issue 10, 2010, Pages 2104-2108

  Shi, Liang ^a   Xu, Yeming ^b   Li, Quan ^b  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC ALUMINIUM OXIDE; ENERGY DISPERSIVE X-RAY SPECTROMETRY; FINE PARTICLES; FORMATION MECHANISM; HARD TEMPLATES; NANOSTRUCTURE ARRAYS; NANOWIRES ARRAYS; RAMAN SPECTRUM; WALL THICKNESS; WELL-ALIGNED; WET-CHEMICAL APPROACH;

NANOWIRES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; X RAY POWDER DIFFRACTION;

NANOTUBES;

METAL NANOPARTICLE; NANOMATERIAL; NANOPARTICLE; NANOTUBE; NANOWIRE; TIN DERIVATIVE; TIN DIOXIDE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; ELECTRON; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; POWDER; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR; SPECTROMETRY; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

CRYSTALLIZATION; ELECTRONS; MATERIALS TESTING; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; NANOPARTICLES; NANOSTRUCTURES; NANOTECHNOLOGY; NANOTUBES; NANOWIRES; POWDERS; SEMICONDUCTORS; SPECTROMETRY, X-RAY EMISSION; SPECTRUM ANALYSIS, RAMAN; TIN COMPOUNDS; X-RAY DIFFRACTION;

EID: 77957891131     PISSN: 20403364     EISSN: 20403372     Source Type: Journal    
DOI: 10.1039/c0nr00279h     Document Type: Article

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