Technology challenges for deep-nano semiconductor

2010 IEEE International Memory Workshop, IMW 2010

Volumn , Issue , 2010, Pages

  Kim, Kinam ^a  

^a SAMSUNG Electronics   (South Korea)

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EID: 77957888957     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMW.2010.5488393     Document Type: Conference Paper

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