Reliable solid-electrolyte crossbar switch for programmable logic device

Digest of Technical Papers - Symposium on VLSI Technology

Volumn , Issue , 2010, Pages 115-116

  Banno, N ^a   Sakamoto, T ^a   Tada, M ^a   Miyamura, M ^a   Yabe, Y ^a   Saito, Y ^a   Ishida, S ^a   Okamoto, K ^a   Hada, H ^a   Kasai, N ^a   Iguchi, N ^a   Aono, M ^b  

^a NEC CORPORATION   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

Programmable logic and reliability under AC stress; Solid electrolyte switch

Indexed keywords

AC STRESS; ALTERNATING CURRENT; CROSSBAR SWITCH; HIGH RELIABILITY; ION MIGRATION; NANOBRIDGE; NEGATIVE BIAS; NON-VOLATILE; OPERATING CONDITION; POSITIVE BIAS; PROGRAMMABLE LOGIC AND RELIABILITY UNDER AC STRESS; PROGRAMMABLE LOGIC DEVICE; PROGRAMMING CURRENTS; STRESS-INDUCED;

CROSSBAR EQUIPMENT; ELECTROLYTES; LOGIC DEVICES; RELIABILITY; SWITCHING NETWORKS;

PROGRAMMABLE LOGIC CONTROLLERS;

EID: 77957881707     PISSN: 07431562     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/VLSIT.2010.5556192     Document Type: Conference Paper

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