Wavelet transform based image template matching for automatic component inspection

International Journal of Advanced Manufacturing Technology

Volumn 50, Issue 9-12, 2010, Pages 1033-1039

  Cho, Han Jin ^a   Park, Tae Hyoung ^a  

^a Chungbuk National University   (South Korea)

Author keywords

Automatic inspection; Electronic assembly system; Template matching; Wavelet transformation

Indexed keywords

AUTOMATIC INSPECTION; DISCRETE WAVELET TRANSFORMATION; ELECTRONIC ASSEMBLY SYSTEMS; IMAGE SIZES; IMAGE TEMPLATE MATCHING; INPUT IMAGE; INSPECTION SYSTEM; MATCHING ALGORITHM; MEMORY SIZE; PROCESSING TIME; STANDARD IMAGES; TEMPLATE-MATCHING ALGORITHMS; WAVELET TRANSFORMATIONS;

ASSEMBLY; CUSTOMER SATISFACTION; INSPECTION; POLYCHLORINATED BIPHENYLS; STANDARDS; TEMPLATE MATCHING;

WAVELET TRANSFORMS;

EID: 77957871632     PISSN: 02683768     EISSN: 14333015     Source Type: Journal    
DOI: 10.1007/s00170-010-2567-9     Document Type: Article

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