On understanding the figures of merit for detection and measurement of X-ray polarization

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7732, Issue , 2010, Pages

  Weisskopf, Martin C ^a   Elsner, Ronald F ^a   O'Dell, Stephen L ^a  

^a NASA MARSHALL SPACE FLIGHT CENTER   (United States)

Author keywords

Statistics; X ray astronomy; X ray polarimetry

Indexed keywords

ASTRONOMICAL SOURCES; FIGURE OF MERIT; FIGURES OF MERITS; FUTURE MISSION; POLARIZATION MEASUREMENTS; STATISTICAL UNCERTAINTY; X-RAY ASTRONOMY; X-RAY POLARIMETRY; X-RAY POLARIZATIONS;

ASTRONOMY; ELLIPSOMETRY; INSTRUMENTS; MEASUREMENTS; OPTICAL TELESCOPES; POLARIMETERS; POLARIZATION; SPACE TELESCOPES; UNCERTAINTY ANALYSIS; X RAYS;

GAMMA RAYS;

EID: 77957864320     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.857357     Document Type: Conference Paper

References (6)

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