3D characterization of thin glass X-ray mirrors via optical profilometry

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7803, Issue , 2010, Pages

  Civitani, M ^a,b   Ghigo, M ^a   Citterio, O ^a   Conconi, P ^a   Spiga, D ^a   Pareschi, G ^a   Proserpio, L ^a,b  

^a INAF OSSERVATORIO ASTRONOMICO DI BRERA   (Italy)

^b UNIVERSITY OF INSUBRIA   (Italy)

Author keywords

active X ray mirrors; IXO telescope; metrology of X ray mirrors; profilometry; thin slumped foil mirrors

Indexed keywords

3D CHARACTERIZATION; 3D SURFACE; ACTIVE X; IXO TELESCOPE; NEW INSTRUMENT; OPTICAL PROFILOMETRY; PROFILOMETERS; SEGMENTED MIRROR; SURFACE UNDER TESTS; THIN GLASS; THIN SLUMPED FOIL MIRRORS; WORKING PRINCIPLES; X RAY MIRRORS;

BUILDINGS; GLASS; MIRRORS; OBSERVATORIES; OPTICAL TELESCOPES; PROFILOMETRY; THREE DIMENSIONAL;

X RAYS;

EID: 77957858067     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.863879     Document Type: Conference Paper

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