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Volumn 7773, Issue , 2010, Pages

Lateral distribution of the degradation of encapsulants after different dampheat exposure times investigated by Raman spectroscopy

Author keywords

Encapsulant; Ethylene vinyl acetate; PV module; Raman spectroscopy; Service life estimation

Indexed keywords

ACCELERATED AGEING TESTS; CRYSTALLINE SI; DAMP-HEAT EXPOSURE; DEGRADATION EFFECT; DEGRADATION PROCESS; DIFFUSION PROCESS; ENCAPSULANTS; ETHYLENE VINYL ACETATE; ETHYLENE VINYL ACETATES; EXPOSURE TIME; HEAT CONDITIONS; LATERAL DISTRIBUTIONS; MATERIALS DEGRADATION; NON DESTRUCTIVE; NON-DESTRUCTIVE MEASUREMENT; PV MODULES; SERVICE LIFE ESTIMATION; SERVICE LIFETIME;

EID: 77957849637     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.860590     Document Type: Conference Paper
Times cited : (3)

References (8)
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  • 4
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.