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Volumn 7773, Issue , 2010, Pages
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Lateral distribution of the degradation of encapsulants after different dampheat exposure times investigated by Raman spectroscopy
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Author keywords
Encapsulant; Ethylene vinyl acetate; PV module; Raman spectroscopy; Service life estimation
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Indexed keywords
ACCELERATED AGEING TESTS;
CRYSTALLINE SI;
DAMP-HEAT EXPOSURE;
DEGRADATION EFFECT;
DEGRADATION PROCESS;
DIFFUSION PROCESS;
ENCAPSULANTS;
ETHYLENE VINYL ACETATE;
ETHYLENE VINYL ACETATES;
EXPOSURE TIME;
HEAT CONDITIONS;
LATERAL DISTRIBUTIONS;
MATERIALS DEGRADATION;
NON DESTRUCTIVE;
NON-DESTRUCTIVE MEASUREMENT;
PV MODULES;
SERVICE LIFE ESTIMATION;
SERVICE LIFETIME;
CAPILLARY FLOW;
DEGRADATION;
ESTIMATION;
ETHYLENE;
PHOTOELECTROCHEMICAL CELLS;
PHOTOVOLTAIC CELLS;
PHOTOVOLTAIC EFFECTS;
RAMAN SCATTERING;
RAMAN SPECTROSCOPY;
SERVICE LIFE;
TESTING;
POLYVINYL ACETATES;
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EID: 77957849637
PISSN: 0277786X
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1117/12.860590 Document Type: Conference Paper |
Times cited : (3)
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References (8)
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