메뉴 건너뛰기




Volumn 46, Issue 3, 2010, Pages 280-284

Compact sensor for environmental monitoring

Author keywords

[No Author keywords available]

Indexed keywords

A PLANTS; ATMOSPHERIC CONTAMINANTS; CONTAMINATION SENSOR; CONTAMINATION SOURCES; DETECTING TRACE; DETECTION SYSTEM; ENVIRONMENTAL MEASUREMENTS; ENVIRONMENTAL MONITORING; FABRICATION PROCESS; GASEOUS SUBSTANCES; GASPHASE; HIGH SENSITIVITY; LSI FABRICATION; NOTE-BOOK COMPUTER; PRODUCT QUALITY; PRODUCTION COST; SEMICONDUCTOR FABRICATION PLANT; SENSOR SYSTEMS; TIME VARYING; UNIVERSAL SERIAL BUS;

EID: 77957830698     PISSN: 00162523     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (1)

References (3)
  • 1
    • 43249103799 scopus 로고    scopus 로고
    • Edition, International Technology Roadmap for Semiconductors
    • International Technology Roadmap for Semiconductors, 2007 Edition, Yield Enhancement. http://www.itrs.net/Links/2007ITRS/2007-Chapters/2007-Yield.pdf
    • (2007) Yield Enhancement
  • 2
    • 84951279351 scopus 로고
    • Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung
    • (in German)
    • G. Sauerbrey: Verwendung von Schwingquarzen zur Wägung dünner Schichten und zur Mikrowägung. (in German), Zeitshrift für Physik, Vol.155, Issue 2, pp. 206-222 (1959).
    • (1959) Zeitshrift für Physik , vol.155 , Issue.2 , pp. 206-222
    • Sauerbrey, G.1
  • 3
    • 77957824355 scopus 로고    scopus 로고
    • Press release: Takane Electronics license technology for Fujitsu's atmospheric-analysis device. (in Japanese)
    • Press release: Takane Electronics license technology for Fujitsu's atmospheric-analysis device. (in Japanese).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.