Nonlinearities in industrial motion stages - Detection and classification

Proceedings of the 2010 American Control Conference, ACC 2010

Volumn , Issue , 2010, Pages 6644-6649

  Rijlaarsdam, David ^a   Van Loon, Bas ^a   Nuij, Pieter ^a   Steinbuch, Maarten ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

DESCRIBING FUNCTIONS; DYNAMICS; FAST FOURIER TRANSFORMS;

EXTERNAL DISTURBANCES; FUNCTION OF FREQUENCY; HIGH PRECISION STAGE; HIGHER ORDER SINUSOIDAL INPUT DESCRIBING FUNCTIONS; LINEAR APPROXIMATIONS; NON-PARAMETRIC MODEL; QUANTITATIVE MEASURES; RANDOMLY DISTRIBUTED;

MOTION ANALYSIS;

EID: 77957762100     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/acc.2010.5531368     Document Type: Conference Paper

References (10)

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