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Volumn , Issue , 2009, Pages 965-970

Active fault diagnosis for systems with reduced model information

Author keywords

Active fault diagnosis; Closed loop systems; Parametric faults; System variations

Indexed keywords

ELECTRIC FAULT CURRENTS; FAILURE ANALYSIS; FAULT DETECTION;

EID: 77957756674     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20090630-4-es-2003.00159     Document Type: Conference Paper
Times cited : (2)

References (20)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.