High-resolution elastic and rotationally inelastic diffraction of D 2 from NiAl(110)

Journal of Chemical Physics

Volumn 133, Issue 12, 2010, Pages

  Barredo, Daniel ^a   Laurent, Guillaume ^a   Nieto, Pablo ^a   Farías, Daniel ^a,b   Miranda, Rodolfo ^a,b,c  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

^b INSTITUTO NICOLÁS CABRERA   (Spain)

^c INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

PROBABILITY;

DIFFRACTION INTENSITY; DIFFRACTION PEAKS; HIGH SENSITIVITY; ORDERS OF MAGNITUDE; RELATIVE INTENSITY; SURFACE TEMPERATURES; TIME-OF-FLIGHT DATA; TRANSITION PROBABILITIES;

DIFFRACTION;

EID: 77957745828     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3479587     Document Type: Article

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