Synthetics of ZnO nanostructures by thermal oxidation in water vapor containing environments

Materials Letters

Volumn 65, Issue 1, 2011, Pages 27-30

  Xu, C H ^a,b   Lui, H F ^b   Surya, C ^b  

^a HENAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (China)

^b HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

Author keywords

Defects; Luminescence; Nanomaterials; Semiconductors; Thin films

Indexed keywords

DEFECT-RELATED EMISSION; DRY OXIDATION; EFFECT OF OXYGEN; GREEN LIGHT; NANO-MATERIALS; OPTICAL AND ELECTRIC PROPERTIES; OXYGEN PARTIAL PRESSURE; PL SPECTRA; RESISTANCE MEASUREMENT; SCANNING ELECTRON MICROSCOPES; SEMICONDUCTORS; THEORY OF DEFECTS; THERMAL OXIDATION; TRANSMISSION ELECTRON MICROSCOPE; WET OXIDATION; X RAY DIFFRACTOMETERS; ZNO FILMS; ZNO NANOSTRUCTURES; ZNO OXIDE;

DEFECTS; ELECTRIC PROPERTIES; ELECTRON MICROSCOPES; LIGHT; LUMINESCENCE; METALLIC FILMS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; OXIDATION; OXYGEN; PARTIAL PRESSURE; POSITIVE IONS; PRESSURE EFFECTS; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR GROWTH; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; WATER VAPOR; ZINC OXIDE;

OXIDE FILMS;

EID: 77957740136     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2010.09.052     Document Type: Article

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