Can a multivalent defect be mimicked by several Shockley-Read-Hall-like defects?

Journal of Applied Physics

Volumn 108, Issue 6, 2010, Pages

  Decock, Koen ^a   Khelifi, Samira ^a   Burgelman, Marc ^a  

^a GHENT UNIVERSITY   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE STATE; ELECTRONIC DEVICE; SHOCKLEY-READ-HALL; THIN FILM SOLAR CELLS;

DEFECTS;

EID: 77957733269     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3487474     Document Type: Article

References (10)

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3. S. B. Zhang, S. H. Wei, A. Zunger, and H. Katayama-Yoshiba, Phys. Rev. B PLRBAQ 0556-2805 57, 9642 (1998). 10.1103/PhysRevB.57.9642
4. A. Milnes, Deep Impurities in Semiconductors (Wiley, New York, 1973).
5. R. E. I. Schropp and M. Zeman, Amorphous and Microcrystalline Silicon Solar Cells (Kluwer Academic, Norwell, 1998).
6. J. Hubin, A. V. Shah, and E. Sauvain, Philos. Mag. Lett. PMLEEG 0950-0839 66, 115 (1992). 10.1080/09500839208229273
7. M. Burgelman, P. Nollet, and S. Degrave, Thin Solid Films THSFAP 0040-6090 361-362, 527 (2007).
8. K. Decock, S. Khelifi, and M. Burgelman, " Modelling multivalent defects in thin film solar cells.," Thin Solid Films THSFAP 0040-6090 (to be published).
9. W. Shockley and J. T. Last, Phys. Rev. PHRVAO 0031-899X 107, 392 (1957). 10.1103/PhysRev.107.392
10. Proceedings of NUMOS, Gent, 28-30 March 2007, edited by, M. Burgelman, J. Verschraegen, B. Minnaert, and, J. Marlein, (Academia, Belgium, 2007), p. 357.