Linking hopping conductivity to giant dielectric permittivity in oxides

Applied Physics Letters

Volumn 97, Issue 13, 2010, Pages

  Artemenko, A ^a,b   Elissalde, C ^b   Chung, U C ^b   Estourns C ^c   Mornet, S ^b   Bykov, I ^a   Maglione, M ^b  

^a FRANTSEVICH INSTITUTE FOR PROBLEMS OF MATERIALS SCIENCE   (Ukraine)

^b UNIVERSITÉ DE BORDEAUX   (France)

^c UNIVERSITÉ PAUL SABATIER   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED DEFECTS; DIELECTRIC BEHAVIOR; ELECTRON PARAMAGNETIC RESONANCE; GIANT DIELECTRIC PERMITTIVITY; HOPPING CONDUCTIVITY; MICROSCOPIC DYNAMICS; THERMAL ACTIVATION;

DEFECTS; PARAMAGNETIC RESONANCE; PERMITTIVITY;

DIELECTRIC MATERIALS;

EID: 77957689519     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3495779     Document Type: Article

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