-
2
-
-
0003626547
-
-
Gatan Inc. Warrendale, PA
-
Ahn, C.C., Krivanek, O.C., EELS Atlas, 1983, Gatan Inc., Warrendale, PA.
-
(1983)
EELS Atlas
-
-
Ahn, C.C.1
Krivanek, O.C.2
-
3
-
-
0021786359
-
-
Ajika, N., Hashimoto, H., Yamaguchi, K., Endoh, H., Jap. J. Appl. Phys. 24 (1985), L41–L44.
-
(1985)
Jap. J. Appl. Phys.
, vol.24
, pp. L41-L44
-
-
Ajika, N.1
Hashimoto, H.2
Yamaguchi, K.3
Endoh, H.4
-
8
-
-
0024699509
-
-
Auerhammer, J., Rez, P., Hofer, F., Ultramicroscopy 30 (1989), 365–370.
-
(1989)
Ultramicroscopy
, vol.30
, pp. 365-370
-
-
Auerhammer, J.1
Rez, P.2
Hofer, F.3
-
10
-
-
0025050520
-
-
Bakenfelder, A., Fromm, I., Reimer, L., J. Micr. 159 (1990), 161–177.
-
(1990)
J. Micr.
, vol.159
, pp. 161-177
-
-
Bakenfelder, A.1
Fromm, I.2
Reimer, L.3
-
11
-
-
85013550038
-
-
San Francisco Press
-
Bakenfelder, A., Reimer, L., Rennekamp, R., Proc. XIIth Int. Congr. for Electron Microscopy, 2, 1990, San Francisco Press 62–63.
-
(1990)
Proc. XIIth Int. Congr. for Electron Microscopy
, vol.2
, pp. 62-63
-
-
Bakenfelder, A.1
Reimer, L.2
Rennekamp, R.3
-
12
-
-
85013562327
-
-
San Francisco Press
-
Barckhaus, R.H., Fromm, I., Höhling, H.J., Reimer, L., Proc. 1lth Int. Congr. for Electron Microscopy, 2, 1990, San Francisco Press 362–363.
-
(1990)
Proc. 1lth Int. Congr. for Electron Microscopy
, vol.2
, pp. 362-363
-
-
Barckhaus, R.H.1
Fromm, I.2
Höhling, H.J.3
Reimer, L.4
-
13
-
-
85013547641
-
-
(submitted)
-
Barckhaus, R.H., Höhling, H.J., Fromm, I., Hirsch, P., Reimer, L., J. Micr., 1991 (submitted).
-
(1991)
J. Micr.
-
-
Barckhaus, R.H.1
Höhling, H.J.2
Fromm, I.3
Hirsch, P.4
Reimer, L.5
-
16
-
-
4243392875
-
-
F. Mayer Academic Press London
-
Bauer, R., Mayer, F., (eds.) Methods in Microbiology, 20, 1988, Academic Press, London, 113–146.
-
(1988)
Methods in Microbiology
, vol.20
, pp. 113-146
-
-
Bauer, R.1
-
17
-
-
0023456263
-
-
Bauer, R., Hezel, U., Kurz, D., Optik 77 (1987), 171–174.
-
(1987)
Optik
, vol.77
, pp. 171-174
-
-
Bauer, R.1
Hezel, U.2
Kurz, D.3
-
18
-
-
85013552060
-
-
San Francisco Press, San Francisco
-
R. Bauer, W. Probst, W.I. Miller, (1988). Proc. 46th Ann. Meeting EMSA, San Francisco Press, San Francisco, pp. 524–525.
-
(1988)
Proc. 46th Ann. Meeting EMSA
, pp. 524-525
-
-
Bauer, R.1
Probst, W.2
Miller, W.I.3
-
21
-
-
12644257968
-
-
Inst. Phys. Conf. Ser. No. 93, Inst. of Physics, Bristol
-
J. Bihr, A. Rilk, G. Benner, (1988). “EUREM 88”, Inst. Phys. Conf. Ser. No. 93, Vol. 1, Inst. of Physics, Bristol, pp. 159–160.
-
(1988)
EUREM
, vol.1
, pp. 159-160
-
-
Bihr, J.1
Rilk, A.2
Benner, G.3
-
24
-
-
4243058401
-
-
Boersch, H., Z Phys. 134 (1953), 156–164.
-
(1953)
Z Phys.
, vol.134
, pp. 156-164
-
-
Boersch, H.1
-
25
-
-
85013556477
-
-
Soc. Francaise de Micr Electronique, Paris
-
Boersch, H., Jeschke, G., Microscopie Electronique, 2, 1970, Soc. Francaise de Micr, Electronique, Paris 183–184.
-
(1970)
Microscopie Electronique
, vol.2
, pp. 183-184
-
-
Boersch, H.1
Jeschke, G.2
-
26
-
-
0039435943
-
-
Boersch, H., Geiger, J., Stickel, W., Z. Physik 180 (1964), 415–424.
-
(1964)
Z. Physik
, vol.180
, pp. 415-424
-
-
Boersch, H.1
Geiger, J.2
Stickel, W.3
-
27
-
-
34250514018
-
-
Boersch, H., Wolter, R., Schoenebeck, H., Z. Physik 199 (1967), 124–134.
-
(1967)
Z. Physik
, vol.199
, pp. 124-134
-
-
Boersch, H.1
Wolter, R.2
Schoenebeck, H.3
-
28
-
-
34250494401
-
-
Boersch, H., Geiger, J., Bohg, A., Z. Physik 227 (1969), 141–151.
-
(1969)
Z. Physik
, vol.227
, pp. 141-151
-
-
Boersch, H.1
Geiger, J.2
Bohg, A.3
-
29
-
-
0015975004
-
-
IITRI Chicago
-
Booker, G.R., Joy, D.C., Spencer, J.P., von Harrach, H., Scanning Electron Microscopy 1974, 1974, IITRI, Chicago 225–234.
-
(1974)
Scanning Electron Microscopy
, pp. 225-234
-
-
Booker, G.R.1
Joy, D.C.2
Spencer, J.P.3
von Harrach, H.4
-
34
-
-
0000277560
-
-
Carlemalm, E., Colliex, C., Kellenberger, E., Adv. Electr. Electron. Phys. 63 (1985), 269–334.
-
(1985)
Adv. Electr. Electron. Phys.
, vol.63
, pp. 269-334
-
-
Carlemalm, E.1
Colliex, C.2
Kellenberger, E.3
-
36
-
-
0013143858
-
-
B.J. Siegel D.R. Beaman John Wiley & Sons New York
-
Castaing, R., Siegel, B.J., Beaman, D.R., (eds.) Physical Aspects of Electron Microscopy and Microanalysis, 1975, John Wiley & Sons, New York, 287–301.
-
(1975)
Physical Aspects of Electron Microscopy and Microanalysis
, pp. 287-301
-
-
Castaing, R.1
-
37
-
-
0002419039
-
-
Castaing, R., Castaing, R., Henry, L., Compt. Rend. Acad. Sci. (Paris) 255 (1962), 76–78.
-
(1962)
Compt. Rend. Acad. Sci. (Paris)
, vol.255
, pp. 76-78
-
-
Castaing, R.1
Castaing, R.2
Henry, L.3
-
38
-
-
0345536836
-
-
Castaing, R., Henoc, P., Henry, L., Natta, M., Compt. Rend. Acad. Sci. (Paris) B265 (1967), 1293–1296.
-
(1967)
Compt. Rend. Acad. Sci. (Paris)
, vol.B265
, pp. 1293-1296
-
-
Castaing, R.1
Henoc, P.2
Henry, L.3
Natta, M.4
-
40
-
-
0344914100
-
-
Chen, C.H., Silcox, J., Vincent, R., Phys. Rev. B 12 (1975), 64–71.
-
(1975)
Phys. Rev. B
, vol.12
, pp. 64-71
-
-
Chen, C.H.1
Silcox, J.2
Vincent, R.3
-
42
-
-
0000464499
-
-
Choi, B.H., Eisenberger, P., Khandelwal, G.S., Atomic Data 5 (1973), 291–304.
-
(1973)
Atomic Data
, vol.5
, pp. 291-304
-
-
Choi, B.H.1
Eisenberger, P.2
Khandelwal, G.S.3
-
45
-
-
0000669690
-
-
J.N. Chapman A.J. Craven Scottish Univ. Sommer School in Physics Edinburgh
-
Colliex, C., Mory, C., Chapman, J.N., Craven, A.J., (eds.) Quantitative Electron Microscopy, 1984, Scottish Univ. Sommer School in Physics, Edinburgh, 149–216.
-
(1984)
Quantitative Electron Microscopy
, pp. 149-216
-
-
Colliex, C.1
Mory, C.2
-
46
-
-
0024533614
-
-
Colliex, C., Mory, C., Olins, A.L., Olins, D.E., Tence, M., J. Micr. 153 (1989), 1–21.
-
(1989)
J. Micr.
, vol.153
, pp. 1-21
-
-
Colliex, C.1
Mory, C.2
Olins, A.L.3
Olins, D.E.4
Tence, M.5
-
48
-
-
0018187634
-
-
Costa, J.L., Joy, D.C., Maher, D.M., Kirk, K.L., Hui, S.W., Science 200 (1978), 537–539.
-
(1978)
Science
, vol.200
, pp. 537-539
-
-
Costa, J.L.1
Joy, D.C.2
Maher, D.M.3
Kirk, K.L.4
Hui, S.W.5
-
49
-
-
84913733990
-
-
IITRI Chicago
-
Cowley, J.M., Smith, D.J., Sussex, G.A., Scanning Electron Microscopy, 1970, IITRI, Chicago pp. 11–16.
-
(1970)
Scanning Electron Microscopy
, pp. 11-16
-
-
Cowley, J.M.1
Smith, D.J.2
Sussex, G.A.3
-
50
-
-
0017679752
-
-
D.L. Misell The Inst, of Physics Conf. Bristol Ser. No. 36
-
Craven, A.J., Colliex, C., Misell, D.L., (eds.) Developments in Electron Microscopy and Analysis, 1977, The Inst, of Physics Conf., Bristol, 271–274 Ser. No. 36.
-
(1977)
Developments in Electron Microscopy and Analysis
, pp. 271-274
-
-
Craven, A.J.1
Colliex, C.2
-
51
-
-
0018032141
-
-
Craven, A.J., Gibson, J.M., Howie, A., Spalding, D.R., Phil. Mag. A38 (1978), 519–527.
-
(1978)
Phil. Mag.
, vol.A38
, pp. 519-527
-
-
Craven, A.J.1
Gibson, J.M.2
Howie, A.3
Spalding, D.R.4
-
53
-
-
37049250176
-
-
Crewe, A.V., Wall, J., Langmore, J., Science 168 (1970), 1338–1340.
-
(1970)
Science
, vol.168
, pp. 1338-1340
-
-
Crewe, A.V.1
Wall, J.2
Langmore, J.3
-
54
-
-
0013143858
-
-
B. Siegel D.R. Beaman Wiley New York
-
Crewe, A.V., Langmore, J.P., Isaacson, M.S., Siegel, B., Beaman, D.R., (eds.) Physical Aspects of Electron Microscopy and Microbeam Analysis, 1975, Wiley, New York, 47–62.
-
(1975)
Physical Aspects of Electron Microscopy and Microbeam Analysis
, pp. 47-62
-
-
Crewe, A.V.1
Langmore, J.P.2
Isaacson, M.S.3
-
55
-
-
84996175988
-
-
Cundy, S.L., Metherell, A.J.F., Whelan, M.J., Phil. Mag. 15 (1967), 623–630.
-
(1967)
Phil. Mag.
, vol.15
, pp. 623-630
-
-
Cundy, S.L.1
Metherell, A.J.F.2
Whelan, M.J.3
-
56
-
-
84996244323
-
-
Cundy, S.L., Metherell, A.J.F., Whelan, M.J., Phil. Mag. 17 (1968), 141–147.
-
(1968)
Phil. Mag.
, vol.17
, pp. 141-147
-
-
Cundy, S.L.1
Metherell, A.J.F.2
Whelan, M.J.3
-
57
-
-
84996224302
-
-
Cundy, S.L., Howie, A., Valdre, U., Phil. Mag. 20 (1969), 147–163.
-
(1969)
Phil. Mag.
, vol.20
, pp. 147-163
-
-
Cundy, S.L.1
Howie, A.2
Valdre, U.3
-
66
-
-
0019084431
-
-
Egerton, R.F., Optik 57 (1980), 229–242.
-
(1980)
Optik
, vol.57
, pp. 229-242
-
-
Egerton, R.F.1
-
70
-
-
33748036871
-
-
Egerton, R.F., Philip, J.G., Turner, P.S., Whelan, M.J., J. Phys E8 (1975), 1033–1037.
-
(1975)
J. Phys
, vol.E8
, pp. 1033-1037
-
-
Egerton, R.F.1
Philip, J.G.2
Turner, P.S.3
Whelan, M.J.4
-
71
-
-
0004204194
-
-
A. Septier Academic Press New York
-
Enge, A.H., Septier, A., (eds.) Focusing of Charged Particles, 2, 1967, Academic Press, New York, 203–264.
-
(1967)
Focusing of Charged Particles
, vol.2
, pp. 203-264
-
-
Enge, A.H.1
-
72
-
-
84985273078
-
-
Eusemann, R., Rose, H., Dubochet, J., J. Micr. 128 (1982), 239–249.
-
(1982)
J. Micr.
, vol.128
, pp. 239-249
-
-
Eusemann, R.1
Rose, H.2
Dubochet, J.3
-
73
-
-
1942450907
-
-
R. Barer V.E. Cosslett Academic Press London
-
Ferrier, R.P., Barer, R., Cosslett, V.E., (eds.) Adv. in Opt. and Electron Microscopy, 3, 1969, Academic Press, London, 155–218.
-
(1969)
Adv. in Opt. and Electron Microscopy
, vol.3
, pp. 155-218
-
-
Ferrier, R.P.1
-
74
-
-
85013563028
-
-
Frank, J., Optik 49 (1973), 81–92.
-
(1973)
Optik
, vol.49
, pp. 81-92
-
-
Frank, J.1
-
75
-
-
0023632186
-
-
Frösch, P., Westphal, Ch., Bauer, R., J. Micr. 147 (1987), 313–321.
-
(1987)
J. Micr.
, vol.147
, pp. 313-321
-
-
Frösch, P.1
Westphal, C.2
Bauer, R.3
-
77
-
-
0015965055
-
-
Gentsch, P., Gilde, H., Reimer, L., J. Micr. 100 (1974), 81–92.
-
(1974)
J. Micr.
, vol.100
, pp. 81-92
-
-
Gentsch, P.1
Gilde, H.2
Reimer, L.3
-
80
-
-
84915926026
-
-
G. Pfefferkorn Remy Münster
-
Hagemann, P., Pfefferkorn, G., (eds.) Beitr. Elektronenmikr. Direktabb. Oberfl., 14, 1981, Remy, Münster, 339–346.
-
(1981)
Beitr. Elektronenmikr. Direktabb. Oberfl.
, vol.14
, pp. 339-346
-
-
Hagemann, P.1
-
82
-
-
0002099162
-
-
R. Barer V.E. Cosslett Academic Press London
-
Hanszen, K.J., Barer, R., Cosslett, V.E., (eds.) Adv. in Optical and Electron Microscopy, 4, 1971, Academic Press, London, 1–84.
-
(1971)
Adv. in Optical and Electron Microscopy
, vol.4
, pp. 1-84
-
-
Hanszen, K.J.1
-
85
-
-
84996146141
-
-
P.R. Swann C.J. Humphreys J.M. Goringe Acad. Press London
-
Hashimoto, H., Swann, P.R., Humphreys, C.J., Goringe, J.M., (eds.) High Voltage Electron Microscopy, 1974, Acad. Press, London, 9–21.
-
(1974)
High Voltage Electron Microscopy
, pp. 9-21
-
-
Hashimoto, H.1
-
86
-
-
0025195506
-
-
Heinrich, U.R., Drechsler, M., Kreutz, W., Mann, W., Ultramicroscopy 32 (1990), 1–6.
-
(1990)
Ultramicroscopy
, vol.32
, pp. 1-6
-
-
Heinrich, U.R.1
Drechsler, M.2
Kreutz, W.3
Mann, W.4
-
88
-
-
24944439854
-
-
Soc. Francaise de Micr. Electr Paris
-
Henoc, P., Natta, M., Henry, L., Microscopie Electronique, 2, 1970, Soc. Francaise de Micr. Electr, Paris 123–124.
-
(1970)
Microscopie Electronique
, vol.2
, pp. 123-124
-
-
Henoc, P.1
Natta, M.2
Henry, L.3
-
89
-
-
0003598030
-
-
Butterworths London
-
Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W., Whelan, M.J., Electron Microscopy of Thin Crystals, 1965, Butterworths, London.
-
(1965)
Electron Microscopy of Thin Crystals
-
-
Hirsch, P.B.1
Howie, A.2
Nicholson, R.B.3
Pashley, D.W.4
Whelan, M.J.5
-
90
-
-
0023132622
-
-
Hofer, F., J. Micr. 145 (1987), 225–231.
-
(1987)
J. Micr.
, vol.145
, pp. 225-231
-
-
Hofer, F.1
-
92
-
-
0024810649
-
-
Hofer, F., J. Micr. 156 (1989), 279–283.
-
(1989)
J. Micr.
, vol.156
, pp. 279-283
-
-
Hofer, F.1
-
93
-
-
0023847321
-
-
Hofer, F., Golob, P., Brunegger, B., Ultramicroscopy 25 (1988), 81–84.
-
(1988)
Ultramicroscopy
, vol.25
, pp. 81-84
-
-
Hofer, F.1
Golob, P.2
Brunegger, B.3
-
94
-
-
77952472954
-
-
Honjo, G., Kodera, S., Kitamura, N., J. Phys. Soc. Japan 19 (1964), 351–367.
-
(1964)
J. Phys. Soc. Japan
, vol.19
, pp. 351-367
-
-
Honjo, G.1
Kodera, S.2
Kitamura, N.3
-
99
-
-
0345896366
-
-
D.W. Palmer M.W. Thompson P.D. Townsend North-Holland Amsterdam
-
Howie, A., Spring, M.S., Tomlinson, P.N., Palmer, D.W., Thompson, M.W., Townsend, P.D., (eds.) Atomic Collision Phenomena in Crystals, 1970, North-Holland, Amsterdam, 34–48.
-
(1970)
Atomic Collision Phenomena in Crystals
, pp. 34-48
-
-
Howie, A.1
Spring, M.S.2
Tomlinson, P.N.3
-
102
-
-
0002251039
-
-
M.A. Hayat Van Nostrand New York
-
Isaacson, M.S., Hayat, M.A., (eds.) Principles and Techniques of Electron Microscopy, 7, 1977, Van Nostrand, New York, 1–78.
-
(1977)
Principles and Techniques of Electron Microscopy
, vol.7
, pp. 1-78
-
-
Isaacson, M.S.1
-
108
-
-
85013509296
-
-
Keusch, P., Guenter, J.R., Bauer, R., Proc. XIth Int. Congr. on Electron Microscopy Kyoto II (1986), 1379–1380.
-
(1986)
Proc. XIth Int. Congr. on Electron Microscopy Kyoto
, vol.2
, pp. 1379-1380
-
-
Keusch, P.1
Guenter, J.R.2
Bauer, R.3
-
110
-
-
0344296939
-
-
Academic Press London
-
Kohl, H., Rose, H., Adv. in Electr. Electron. Physics, 65, 1985, Academic Press, London 175–200.
-
(1985)
Adv. in Electr. Electron. Physics
, vol.65
, pp. 175-200
-
-
Kohl, H.1
Rose, H.2
-
112
-
-
33748089824
-
-
Komuro, M., Kojima, S., Ichinokawa, T., J. Phys. Soc. Japan 33 (1972), 1415–1419.
-
(1972)
J. Phys. Soc. Japan
, vol.33
, pp. 1415-1419
-
-
Komuro, M.1
Kojima, S.2
Ichinokawa, T.3
-
113
-
-
0343682220
-
-
Koppe, H., Z. Physik 124 (1948), 658–664.
-
(1948)
Z. Physik
, vol.124
, pp. 658-664
-
-
Koppe, H.1
-
114
-
-
0025347285
-
-
Körtje, K.H., Freihöfer, D., Rahmann, H., Ultramicroscopy 32 (1990), 12–17.
-
(1990)
Ultramicroscopy
, vol.32
, pp. 12-17
-
-
Körtje, K.H.1
Freihöfer, D.2
Rahmann, H.3
-
116
-
-
0023023630
-
-
Krivanek, O.L., Ahn, C.C., Keeney, R.B., Ultramicroscopy 22 (1987), 103–116.
-
(1987)
Ultramicroscopy
, vol.22
, pp. 103-116
-
-
Krivanek, O.L.1
Ahn, C.C.2
Keeney, R.B.3
-
117
-
-
0000414392
-
-
Kunz, M., Moller, M., Cantow, H.J., Makromol. Chemie 68 (1987), 401–410.
-
(1987)
Makromol. Chemie
, vol.68
, pp. 401-410
-
-
Kunz, M.1
Moller, M.2
Cantow, H.J.3
-
121
-
-
84986658997
-
-
G.W. Bailey San Francisco Press
-
Langmore, J.P., Athey, B.D., Bailey, G.W., (eds.) Proc. 45th Ann. Meeting of EMSA, 1987, San Francisco Press, 652–653.
-
(1987)
Proc. 45th Ann. Meeting of EMSA
, pp. 652-653
-
-
Langmore, J.P.1
Athey, B.D.2
-
122
-
-
0015660766
-
-
Langmore, J.P., Wall, J., Isaacson, M.S., Optik 38 (1973), 335–350.
-
(1973)
Optik
, vol.38
, pp. 335-350
-
-
Langmore, J.P.1
Wall, J.2
Isaacson, M.S.3
-
123
-
-
0022734165
-
-
Lanio, S., Optik 73 (1986), 99–107.
-
(1986)
Optik
, vol.73
, pp. 99-107
-
-
Lanio, S.1
-
124
-
-
0022721922
-
-
Lanio, S., Rose, H., Krahl, D., Optik 73 (1986), 56–58.
-
(1986)
Optik
, vol.73
, pp. 56-58
-
-
Lanio, S.1
Rose, H.2
Krahl, D.3
-
125
-
-
0006818583
-
-
Lautenschläger, H., Röding, H., Ghyczy, M., Seifen—öle—Fette—Wachse 114 (1987), 531–534.
-
(1987)
Seifen
, vol.114
, pp. 531-534
-
-
Lautenschläger, H.1
Röding, H.2
Ghyczy, M.3
-
127
-
-
36749115628
-
-
Leapman, R.D., Rez, P., Mayers, D.F., J. Chem. Phys. 11 (1980), 1232–1243.
-
(1980)
J. Chem. Phys.
, vol.11
, pp. 1232-1243
-
-
Leapman, R.D.1
Rez, P.2
Mayers, D.F.3
-
129
-
-
0024744286
-
-
Lehmpfuhl, G., Krahl, D., Swoboda, M., Ultramicroscopy 31 (1989), 161–168.
-
(1989)
Ultramicroscopy
, vol.31
, pp. 161-168
-
-
Lehmpfuhl, G.1
Krahl, D.2
Swoboda, M.3
-
132
-
-
11744345876
-
-
Leonhardt, R., Richter, H., Rossteutscher, W., Z. Physik 165 (1961), 121–150.
-
(1961)
Z. Physik
, vol.165
, pp. 121-150
-
-
Leonhardt, R.1
Richter, H.2
Rossteutscher, W.3
-
133
-
-
84986672256
-
-
Lippert, W., Optik 11 (1954), 412–421.
-
(1954)
Optik
, vol.11
, pp. 412-421
-
-
Lippert, W.1
-
134
-
-
84981475068
-
-
Lippert, W., Optik 13 (1956), 506–515.
-
(1956)
Optik
, vol.13
, pp. 506-515
-
-
Lippert, W.1
-
135
-
-
0024030265
-
-
Liu, Z.Q., McKenzie, D.R., Cockayne, D.J.H., Dwarte, D.M., Phil. Mag. B57 (1988), 753–761.
-
(1988)
Phil. Mag.
, vol.B57
, pp. 753-761
-
-
Liu, Z.Q.1
McKenzie, D.R.2
Cockayne, D.J.H.3
Dwarte, D.M.4
-
136
-
-
0002596105
-
-
B. Crasemann Academic Press New York
-
Madison, D.H., Merzbacher, E., Crasemann, B., (eds.) Atomic Inner Shell Processes, 1, 1975, Academic Press, New York, 1–72.
-
(1975)
Atomic Inner Shell Processes
, vol.1
, pp. 1-72
-
-
Madison, D.H.1
Merzbacher, E.2
-
139
-
-
84913342726
-
-
M.J. Goringe Inst, of Physics Bristol Inst, of Physics. Conf. Ser. No. 61
-
Marks, L.D., Goringe, M.J., (eds.) Electron Microscopy and Analysis, 1982, Inst, of Physics, Bristol, 259–262 Inst, of Physics. Conf. Ser. No. 61.
-
(1982)
Electron Microscopy and Analysis
, pp. 259-262
-
-
Marks, L.D.1
-
140
-
-
0024701356
-
-
Martin, J.M., Mansot, J.L., Hallouis, M., Ultramicroscopy 30 (1989), 321–328.
-
(1989)
Ultramicroscopy
, vol.30
, pp. 321-328
-
-
Martin, J.M.1
Mansot, J.L.2
Hallouis, M.3
-
141
-
-
84914397313
-
-
San Francisco Press
-
McMullan, D., Rodenburg, J.M., Pike, W.T., Proc. XIIth Int. Congr. for Electron Microscopy, 2, 1990, San Francisco Press 104–105.
-
(1990)
Proc. XIIth Int. Congr. for Electron Microscopy
, vol.2
, pp. 104-105
-
-
McMullan, D.1
Rodenburg, J.M.2
Pike, W.T.3
-
143
-
-
1842568662
-
-
R. Barer V.E. Cosslett Academic Press London
-
Metherell, A.J.F., Barer, R., Cosslett, V.E., (eds.) Adv. in Optical and Electron Microscopy, 4, 1971, Academic Press, London, 263–361.
-
(1971)
Adv. in Optical and Electron Microscopy
, vol.4
, pp. 263-361
-
-
Metherell, A.J.F.1
-
151
-
-
85013538840
-
-
SEM Inc., AMF O'Hare Chicago 1867–1875
-
Ottensmeyer, F.P., Arsenault, A.L., Scanning Electron Microscopy 1983/IV, 1983, SEM Inc., AMF O'Hare, Chicago 1867–1875.
-
(1983)
Scanning Electron Microscopy 1983/IV
-
-
Ottensmeyer, F.P.1
Arsenault, A.L.2
-
152
-
-
0024216844
-
-
Ottensmeyer, F.P., Andrews, D.W., Arsenault, A.L., Heng, Y.M., Simon, G.T., Weatherley, G.C., Scanning 10 (1988), 227–238.
-
(1988)
Scanning
, vol.10
, pp. 227-238
-
-
Ottensmeyer, F.P.1
Andrews, D.W.2
Arsenault, A.L.3
Heng, Y.M.4
Simon, G.T.5
Weatherley, G.C.6
-
153
-
-
0016577409
-
-
Perez, J., Zanchi, G., Sevely, J., Jouffrey, B., Optik 43 (1975), 487–494.
-
(1975)
Optik
, vol.43
, pp. 487-494
-
-
Perez, J.1
Zanchi, G.2
Sevely, J.3
Jouffrey, B.4
-
155
-
-
85013510971
-
-
Australian Acad, of Science Canberra 276–277
-
Philip, J.G., Whelan, M.J., Egerton, R.F., Electron Microscopy 1974, I, 1974, Australian Acad, of Science, Canberra 276–277.
-
(1974)
Electron Microscopy
, vol.1
-
-
Philip, J.G.1
Whelan, M.J.2
Egerton, R.F.3
-
157
-
-
0024645160
-
-
Probst, W., Zellmann, E., Bauer, R., Ultramicroscopy 28 (1989), 312–314.
-
(1989)
Ultramicroscopy
, vol.28
, pp. 312-314
-
-
Probst, W.1
Zellmann, E.2
Bauer, R.3
-
159
-
-
34250277967
-
-
Pyrlik, J., Z. Phys. B 31 (1978), 369–375.
-
(1978)
Z. Phys. B
, vol.31
, pp. 369-375
-
-
Pyrlik, J.1
-
160
-
-
85013529457
-
-
Australian Acad. Sci. Canberra 336–337
-
Rackham, G.M., Jones, P.M., Steeds, J.W., Electron Microscopy 1974, I, 1974, Australian Acad. Sci., Canberra 336–337.
-
(1974)
Electron Microscopy
, vol.1
-
-
Rackham, G.M.1
Jones, P.M.2
Steeds, J.W.3
-
161
-
-
0002662236
-
Excitation of Plasmons and Interband Transitions by Electrons
-
Springer, Berlin Heidelberg, New York
-
Raether, H., Excitation of Plasmons and Interband Transitions by Electrons. Springer Tracts in Modern Physics, 88, 1980, Springer, Berlin, Heidelberg, New York.
-
(1980)
Springer Tracts in Modern Physics
, vol.88
-
-
Raether, H.1
-
163
-
-
0021300261
-
-
SEM Inc. AMF O'Hare Chicago 1011–1021
-
Reichelt, R., Carlemalm, E., Engel, A., Scanning Electron Microscopy 1984/11, 1984, SEM Inc., AMF O'Hare Chicago 1011–1021.
-
(1984)
Scanning Electron Microscopy 1984/11
-
-
Reichelt, R.1
Carlemalm, E.2
Engel, A.3
-
166
-
-
85013523307
-
-
Inst, of Phys. Conf. Ser London, Bristol No. 18 120–125
-
Reimer, L., Scanning Electron Microscopy: Systems and Applications, 1973, Inst, of Phys. Conf. Ser, London, Bristol No. 18 120–125.
-
(1973)
Scanning Electron Microscopy: Systems and Applications
-
-
Reimer, L.1
-
168
-
-
0003521686
-
-
Springer Ser. in Optical Sciences Springer, Berlin, Heidelberg, New York
-
Reimer, L., Transmission Electron Microscopy, Physics of Image Formation and Microanalysis. 2nd ed., 36, 1989, Springer Ser. in Optical Sciences, Springer, Berlin, Heidelberg, New York.
-
(1989)
Transmission Electron Microscopy, Physics of Image Formation and Microanalysis. 2nd ed.
, vol.36
-
-
Reimer, L.1
-
172
-
-
84914399059
-
-
IITRI Chicago
-
Reimer, L., Hagemann, P., Scanning Electron Microscopy 1976/11, 1976, IITRI, Chicago pp. 321–328.
-
(1976)
Scanning Electron Microscopy 1976/11
, pp. 321-328
-
-
Reimer, L.1
Hagemann, P.2
-
179
-
-
85013526733
-
-
Westdeutscher Verlag Opladen (FRG)
-
Reimer, L., Badde, H.G., Drewes, E., Gilde, H., Kappert, H., Höhling, H.J., von Bassewitz, D.B., Rössner, A., Forschungsber. des Landes Nordrhein-Westfalen Nr.2314, 1973, Westdeutscher Verlag, Opladen (FRG).
-
(1973)
Forschungsber. des Landes Nordrhein-Westfalen Nr.2314
-
-
Reimer, L.1
Badde, H.G.2
Drewes, E.3
Gilde, H.4
Kappert, H.5
Höhling, H.J.6
von Bassewitz, D.B.7
Rössner, A.8
-
180
-
-
58049146570
-
-
Inst, of Phys. Conf. Ser. Bristol, London No. 36
-
Reimer, L., Pöpper, W., Volbert, B., Developments in Electron Microscopy and Analysis, 1977, Inst, of Phys. Conf. Ser., Bristol, London pp. 259–262 No. 36.
-
(1977)
Developments in Electron Microscopy and Analysis
, pp. 259-262
-
-
Reimer, L.1
Pöpper, W.2
Volbert, B.3
-
181
-
-
5344247029
-
-
Reimer, L., Brockmann, K., Rhein, U., J. Phys. D 11 (1978), 2151–2155.
-
(1978)
J. Phys.
, vol.D 11
, pp. 2151-2155
-
-
Reimer, L.1
Brockmann, K.2
Rhein, U.3
-
182
-
-
84984059530
-
-
Reimer, L., Heilers, U., Saliger, G., Scanning 8 (1986), 101–118.
-
(1986)
Scanning
, vol.8
, pp. 101-118
-
-
Reimer, L.1
Heilers, U.2
Saliger, G.3
-
183
-
-
0023869131
-
-
Reimer, L., Fromm, I., Rennekamp, R., Ultramicroscopy 24 (1988), 339–354.
-
(1988)
Ultramicroscopy
, vol.24
, pp. 339-354
-
-
Reimer, L.1
Fromm, I.2
Rennekamp, R.3
-
185
-
-
0025267706
-
-
Reimer, L., Fromm, I., Naundorf, I., Ultramicroscopy 32 (1990), 80–91.
-
(1990)
Ultramicroscopy
, vol.32
, pp. 80-91
-
-
Reimer, L.1
Fromm, I.2
Naundorf, I.3
-
186
-
-
85013542662
-
-
(in press)
-
Reimer, L., Rennekamp, R., Langenfeld, M., J. Micr., 1991 (in press).
-
(1991)
J. Micr.
-
-
Reimer, L.1
Rennekamp, R.2
Langenfeld, M.3
-
190
-
-
0020301686
-
-
Roberts, P.T.E., Chapman, J.N., MacLeod, A.M., Ultramicroscopy 8 (1982), 385–396.
-
(1982)
Ultramicroscopy
, vol.8
, pp. 385-396
-
-
Roberts, P.T.E.1
Chapman, J.N.2
MacLeod, A.M.3
-
191
-
-
0023392283
-
-
Rose, H., Optik 77 (1987), 26–34.
-
(1987)
Optik
, vol.77
, pp. 26-34
-
-
Rose, H.1
-
194
-
-
58749095874
-
-
Schäfer, L., Yates, A.C., Bonham, R.A., J. Chem. Phys. 55 (1971), 3055–3056.
-
(1971)
J. Chem. Phys.
, vol.55
, pp. 3055-3056
-
-
Schäfer, L.1
Yates, A.C.2
Bonham, R.A.3
-
198
-
-
4243289930
-
-
Academic Press New York
-
Sevely, J., Perez, J.P., Jouffrey, B., “High Voltage Electron Microscopy”, pp. 32–37, 1974, Academic Press, New York.
-
(1974)
High Voltage Electron Microscopy
-
-
Sevely, J.1
Perez, J.P.2
Jouffrey, B.3
-
200
-
-
0002916333
-
-
R.H. Geiss San Francisco Press San Francisco
-
Shuman, H., Somlyo, A.P., Geiss, R.H., (eds.) Analytical Electron Microscopy—1981, 1981, San Francisco Press, San Francisco, 202–204.
-
(1981)
Analytical Electron Microscopy
, pp. 202-204
-
-
Shuman, H.1
Somlyo, A.P.2
-
202
-
-
0022924059
-
-
Shuman, H., Chang, C.F., Bahle, E.F., Somlyo, A.P., Ann. New York Acad. Sci. 483 (1986), 295–310.
-
(1986)
Ann. New York Acad. Sci.
, vol.483
, pp. 295-310
-
-
Shuman, H.1
Chang, C.F.2
Bahle, E.F.3
Somlyo, A.P.4
-
204
-
-
0019246332
-
-
Spence, J.C.H., Optik 57 (1980), 451–456.
-
(1980)
Optik
, vol.57
, pp. 451-456
-
-
Spence, J.C.H.1
-
216
-
-
0016027680
-
-
Wall, J., Isaacson, M., Langmore, J.P., Optik 39 (1974), 359–374.
-
(1974)
Optik
, vol.39
, pp. 359-374
-
-
Wall, J.1
Isaacson, M.2
Langmore, J.P.3
-
221
-
-
84914244330
-
-
Inst, of Physics, London, Bristol
-
B.G. Williams, A.J. Bourdillon, 1981 “Inst. Phys. Conf. Ser. No. 61,” Inst, of Physics, London, Bristol, pp. 205–208.
-
(1981)
Inst. Phys. Conf. Ser. No.
, pp. 205-208
-
-
Williams, B.G.1
Bourdillon, A.J.2
-
223
-
-
0021757725
-
-
Williams, B.G., Sparrow, T.G., Egerton, R.F., Proc. Roy. Soc. London A 393 (1984), 409–422.
-
(1984)
Proc. Roy. Soc. London A
, vol.393
, pp. 409-422
-
-
Williams, B.G.1
Sparrow, T.G.2
Egerton, R.F.3
-
225
-
-
0010368009
-
-
Zanchi, G., Sevely, J., Jouffrey, B., J. Micr. Spectrosc. Electron. 2 (1977), 95–104.
-
(1977)
J. Micr. Spectrosc. Electron.
, vol.2
, pp. 95-104
-
-
Zanchi, G.1
Sevely, J.2
Jouffrey, B.3
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