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Volumn 97, Issue 13, 2010, Pages

Carrier recombination mechanisms and efficiency droop in GaInN/GaN light-emitting diodes

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE REGIONS; CARRIER LEAKAGE; CARRIER RECOMBINATION; EXPERIMENTAL DATA; NON-RADIATIVE; POWER SERIES; THIRD-ORDER;

LIGHT EMISSION;

LIGHT EMITTING DIODES;

EID: 77957660712 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3493654 Document Type: Article

Times cited : (202)

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