Direct measurement of electron loss rate in air

Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference: 2010 Laser Science to Photonic Applications, CLEO/QELS 2010

Volumn , Issue , 2010, Pages

  Dogariu, Arthur ^a   Shneider, Mikhail N ^a   Miles, Richard B ^a  

^a PRINCETON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRONICS ENGINEERING; ELECTRONICS INDUSTRY;

ATMOSPHERIC AIR; DIRECT MEASUREMENT; ELECTRON ATTACHMENT; LOCAL MEASUREMENT; MICROWAVE SCATTERING; NANOSECOND RESOLUTION; RECOMBINATION RATE; RESONANTLY ENHANCED MULTIPHOTON IONIZATION;

PHOTOIONIZATION;

EID: 77957584709     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1364/qels.2010.jtud2     Document Type: Conference Paper

References (4)

1. A. V. Phelps, "Laboratory studies of electron attachment and detachment processes of aeronomic interest," Can. J. Chemistry 47, 1783 (1969).
2. 2 mixtures-" Chem. Phys. 12, 439 (1976).
3. M.N. Shneider and R.B. Miles, "Microwave Diagnostics of Small Plasma Objects," J. Appl. Phys. 98, 0033301-1 - 033301-3 (2006)
4. Z. Zhang, M.N. Shneider, and R.B. Miles, "Coherent Microwave Rayleigh Scattering from Resonance-Enhanced Multiphoton Ionization in Argon," Phys. Rev. Lett. 98, 265005-1 - 265005-4 (2007).