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Volumn 114, Issue 39, 2010, Pages 16696-16699

Structural relaxation in nanometer thin layers of glycerol

Author keywords

[No Author keywords available]

Indexed keywords

BROAD-BAND DIELECTRIC SPECTROSCOPY; CLOSE PROXIMITY; COOPERATIVE DYNAMICS; ENHANCED MOBILITY; FREE SURFACES; GEOMETRICAL CONSTRAINTS; GLASS TRANSITION TEMPERATURE; IN-SITU; MOLECULAR DEPOSITION; MOLECULAR LAYER; NANOMETER THIN FILMS; SIZE EFFECTS; SLOW DESORPTION; SYSTEMATIC INVESTIGATIONS; THICKNESS REDUCTION; THIN LAYERS;

EID: 77957579284     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp108151p     Document Type: Article
Times cited : (36)

References (24)
  • 14
    • 77957600344 scopus 로고    scopus 로고
    • Measurements on films below 1 nm could not be performed over a wide temperature range due to film instability
    • Measurements on films below 1 nm could not be performed over a wide temperature range due to film instability.
  • 23
    • 77957580042 scopus 로고    scopus 로고
    • Both the values of m and n are intrinsically lower than those obtained for bulk glycerol probed with an isotropi electric field, for thicknesses at least up to 50 nm; this discrepancy can be ascribed to the different geometrical configuration adopted for the thin films (see ref 16)
    • Both the values of m and n are intrinsically lower than those obtained for bulk glycerol probed with an isotropi electric field, for thicknesses at least up to 50 nm; this discrepancy can be ascribed to the different geometrical configuration adopted for the thin films (see ref 16).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.