Investigations on the partial discharge behavior of syntactic foam under uniform field stress

Conference Record of IEEE International Symposium on Electrical Insulation

Volumn , Issue , 2010, Pages

  Strauchs, Anja ^a   Mashkin, Andrey ^a   Schnettler, Armin ^a   Podlazly, Jörn ^b   Freiheit Jensen, Bernd ^b  

^a RWTH AACHEN UNIVERSITY   (Germany)

^b PHILIPS HEALTHCARE   (United States)

Author keywords

Hollow microsphere; Partial discharge; Syntactic foam; Uniform field stress

Indexed keywords

AC FIELD; BREAKDOWN PROCESS; COMPOSITE INSULATION; ELECTRICAL STRESS; GASEOUS DIELECTRICS; HOLLOW GLASS MICROSPHERES; HOLLOW MICROSPHERE; MATERIAL STRUCTURE; NONUNIFORM FIELD; PARTIAL DISCHARGE ACTIVITY; PARTIAL DISCHARGE BEHAVIORS; RESULTING MATERIALS; SYNTACTIC FOAM; SYNTACTIC FOAMS; UNIFORM FIELDS;

EPOXY RESINS; FOAMS; INSULATING MATERIALS; MICROSPHERES; RESINS; SCANNING ELECTRON MICROSCOPY; SYNTACTICS; TECHNICAL PRESENTATIONS;

PARTIAL DISCHARGES;

EID: 77957366303     PISSN: 01642006     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ELINSL.2010.5549809     Document Type: Conference Paper

References (2)

1. A. Troeger, H. Negle, B. Heil, A. Schnettler, "Investigation on Treeing Behaviour and Breakdown Mechanisms in Syntactic Foam", XVth International Symposium on High Voltage Engineering, Ljubljana 2007.
2. IEC 60270, "High-voltage test techniques - Partial discharge measurement".