'Fitness-for-intended-use' is an important concept in measurement

Accreditation and Quality Assurance

Volumn 15, Issue 10, 2010, Pages 545-546

  de Bièvre, Paul ^a  

^a NONE

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957364710     PISSN: 09491775     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00769-010-0696-3     Document Type: Editorial

References (14)

1. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html.
2. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 9.
3. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 9, Note 2.
4. De Bièvre P (2009) Manufacturing a chain logically starts with manufacturing the first link, thus is logically started a metrological traceability chain. Accred Qual Assur 14: 517-519.
5. De Bièvre P (2009) Ensuring the potential for an intended quality of a measurement result must be done before and during the measurement, not after it (when it is too late). Accred Qual Assur 14: 351-352.
6. De Bièvre P (2006) On 'quality of a measurement result'. Accred Qual Assur 11: 597-598.
7. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 3. 2.
8. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 5. 12.
9. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 34.
10. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 28.
11. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 29.
12. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 6.
13. De Bièvre P (2007) Fitness for purpose is different from a performance specification. Accred Qual Assur 12: 501.
14. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML, The International Vocabulary of metrology - Basic and general concepts and associated terms (VIM), 3rd edition, JCGM 200: 2008; it is usually called "VIM 3" http://www. bipm. org/en/publications/guides/vim. html entry 2. 3.