Report on the 33rd Meeting of ISO/REMCO

Accreditation and Quality Assurance

Volumn 15, Issue 10, 2010, Pages 595-597

  Emons, Hendrik ^a   Davies, Stephen R ^b   Hammond, John P ^c   Sauvage, Stéphane ^d  

^a JOINT RESEARCH CENTRE   (Italy)

^b Chemical and Biological Metrology Branch National Measurement Institute   (Australia)

^c Starna Scientific Limited   (United Kingdom)

^d ISO Central Secretariat   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957344001     PISSN: 09491775     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00769-010-0703-8     Document Type: Article

References (8)

1. Emons H, Fajgelj A, Hammond JP, Sauvage S (2009) Accred Qual Assur 14: 639-642.
2. International Organization for Standardization (2009) ISO Guide 34-General requirements for the competence of reference material producers, 3rd edn. ISO, Geneva.
3. International Organization for Standardization (2005) ISO/IEC 17025-General requirements for the competence of testing and calibration laboratories, 2nd edn. ISO, Geneva.
4. International Organization for Standardization (1992/Amd 1: 2008) ISO Guide 30-Terms and definitions used in connection with reference materials. ISO, Geneva.
5. International Organization for Standardization (2006) ISO Guide 35-Reference materials-General and statistical principles of certification, 2nd edn. ISO, Geneva.
6. Fleming J, Neidhart B, Tausch C, Wegscheider W (1996) Accred Qual Assur 1: 41-43.
7. International Organization for Standardization (2007) ISO/IEC Guide 99-International vocabulary of metrology-Basic and general concepts and associated terms (VIM). ISO, Geneva.
8. BIPM, IEC, IFCC, ILAC, IUPAC, IUPAP, ISO, OIML (2008) International vocabulary of metrology-Basic and general concepts and associated terms (VIM), 3rd edn. JCGM 200: 2008. http://www. bipm. org/en/publications/guides/vim. html.