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Solid State Ionics

Volumn 181, Issue 31-32, 2010, Pages 1420-1424

Diffusion induced grain-boundary migration in SrO-doped CeO2 electrolyte and its effect on electrical properties

(6) Cho, Pyeong Seok a Park, Seung Young a Kim, Jeong Joo a,b Do, Hyoung Seok c Park, Hyun Min c Lee, Jong Heun a

a Korea University (South Korea)

b Kyungpook National University (South Korea)

c Korea Research Institute of Standards and Science (South Korea)

Author keywords

Complex Impedance Spectroscopy; Diffusion induced grain boundary migration; Grain boundary conduction; SrO doped CeO2

Indexed keywords

BOUNDARY MIGRATION; COMPLEX IMPEDANCE SPECTROSCOPY; CONSTRICTION EFFECTS; DOPED CEO; ELECTRICAL PROPERTY; GRAIN BOUNDARY MIGRATIONS; GRAIN BOUNDARY STRUCTURE; PHYSICO-CHEMICAL CHANGES;

ELECTRIC IMPEDANCE MEASUREMENT; ELECTRIC PROPERTIES; SINTERING;

DIFFUSION;

EID: 77957255289 PISSN: 01672738 EISSN: None Source Type: Journal
DOI: 10.1016/j.ssi.2010.07.033 Document Type: Article

Times cited : (11)

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