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Volumn 405, Issue 3, 2010, Pages 216-234

Ab initio-based diffusion theory and tracer diffusion in Ni-Cr and Ni-Fe alloys

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO; AB INITIO MODELING; ARRHENIUS; DIFFUSING SPECIES; DIFFUSION COEFFICIENTS; DIFFUSION DATA; DIFFUSION THEORY; DIFFUSIVITIES; ELECTRONIC CONTRIBUTIONS; ELECTRONIC EXCITATION EFFECT; INTERSTITIAL DEFECTS; INTERSTITIAL DIFFUSION; KINETIC INFORMATION; MIGRATION BARRIERS; MODELING RESULTS; NON-ARRHENIUS BEHAVIOR; PHENOMENOLOGICAL COEFFICIENTS; PREEXPONENTIAL FACTOR; SIGNIFICANT IMPACTS; SOLUTE DRAG; TEMPERATURE DEPENDENT; TRACER DIFFUSION; TRACER DIFFUSION COEFFICIENTS; VACANCY DIFFUSION MECHANISM; WEAK INTERACTIONS;

EID: 77957241844     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2010.08.003     Document Type: Article
Times cited : (136)

References (76)
  • 25
    • 0003869768 scopus 로고
    • Springer-Verlag Berlin, New York
    • P. Ehrhart Atomic Defects in Metals vol. 25 1991 Springer-Verlag Berlin, New York pp. 88
    • (1991) Atomic Defects in Metals , vol.25
    • Ehrhart, P.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.