Unit root tests with wavelets

Econometric Theory

Volumn 26, Issue 5, 2010, Pages 1305-1331

  Fan, Yanqin ^a   Gençay, Ramazan ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957238654     PISSN: 02664666     EISSN: 14694360     Source Type: Journal    
DOI: 10.1017/S0266466609990594     Document Type: Article

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