Recent trends in parts seu susceptibility from heavy ions

IEEE Transactions on Nuclear Science

Volumn 34, Issue 6, 1987, Pages 1332-1337

  Nichols, D K ^a   Smith, L S ^a   Price, W E ^a   Koga, R ^b   Kolasinski, W A ^b  

^a CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

^b AEROSPACE CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957237310     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1987.4337475     Document Type: Article

References (2)

1. D. K. Nichols, W. E. Price, W. A. Kolasinski, R. Koga, J. C. Pickel, J. T. Blandford, A. E. Waskiewicz, “Trends in Parts Susceptibility to Single Event Upset from Heavy Ions,” IEEE Trans. on Nuc. Sci., NS-32, No. 6, 4189 (Dec. (1985). NS-32.
2. D. K. Nichols, W. E. Price, M. A. Shoga, J. R. Duffey, W. A. Kolasinski, R. Koga, “Discovery of Heavy-Ion Induced Latchup in CMOS/epi Devices,” IEEE Trans. on Nuc. Sci., NS-33, No. 6, 1696 (Dec. 1986)