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Volumn 9, Issue 1, 2011, Pages 230-241

Trap-assisted tunnelling current in MIM structures

Author keywords

high permittivity dielectrics; I V characteristics; MIM; trap assisted tunnelling

Indexed keywords


EID: 77957232484     PISSN: 18951082     EISSN: 16443608     Source Type: Journal    
DOI: 10.2478/s11534-010-0027-7     Document Type: Article
Times cited : (12)

References (15)
  • 12
    • 77957232374 scopus 로고    scopus 로고
    • J. Präšek, M. Adémek, and I. Szendiuch (Eds.), 13-17 May 2009, Brno, Czech Republic, Brno University of Technology, Brno, Brno: Brno University of Technology
    • J. Racko et al., In: J. Präšek, M. Adémek, I. Szendiuch (Eds.), 32nd International Spring Seminar on Electronics Technology, 13-17 May 2009, Brno, Czech Republic (Brno University of Technology, Brno, 2009) 256.
    • (2009) 32nd International Spring Seminar on Electronics Technology , pp. 256
    • Racko, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.