Characteristics of SEU current transients and collected charge in GaAs and Si devices

IEEE Transactions on Nuclear Science

Volumn 32, Issue 6, 1985, Pages 4104-4109

  Campbell, D E ^b   Moriwaki, M M ^a   Digby, W M ^a   Srour, J R ^a  

^a NORTHROP GRUMMAN CORPORATION   (United States)

^b LAWRENCE LIVERMORE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 77957226828     PISSN: 00189499     EISSN: 15581578     Source Type: Journal    
DOI: 10.1109/TNS.1985.4334076     Document Type: Article

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