Thermoelastic analysis of a silicon surface under x-ray free-electron-laser irradiation

Review of Scientific Instruments

Volumn 81, Issue 7, 2010, Pages

  De Castro, A R B ^a,b   Vasconcellos, Aurea R ^a   Luzzi, Roberto ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

^b LABORATÓRIO NACIONAL DE LUZ SÍNCROTRON   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

FEMTOSECONDS; OPTICAL COMPONENTS; PARTIAL ABSORPTION; SILICON SUBSTRATES; SILICON SURFACES; SOFT X-RAY PULSE; THERMAL DISTORTIONS; THERMO-ELASTIC BEHAVIOR; THERMODYNAMIC VARIABLES; THERMOELASTIC ANALYSIS; TIME EVOLUTIONS; TIME-DEPENDENT; WORST CASE SCENARIO; X RAY PULSE;

ABSORPTION; LOCOMOTIVES; OPTICAL SYSTEMS; RAILROAD CARS; THERMOELASTICITY;

X RAYS;

EID: 77957138804     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3455203     Document Type: Article

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