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Volumn 82, Issue 3, 2010, Pages

Probing photoelectron multiple interferences via Fourier spectroscopy in energetic photoionization of Xe@C60

Author keywords

[No Author keywords available]

Indexed keywords

CROSS SECTION; ENDOHEDRAL COMPOUNDS; FOURIER SPECTROSCOPY; IONIZATION CROSS SECTION; IONIZATION MODES; MULTIPLE INTERFERENCES; OSCILLATION FREQUENCY; PLASMON RESONANCES; SINGLE-ELECTRON LEVELS; SPECTRAL CHARACTERS;

EID: 77957137436     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.82.033201     Document Type: Article
Times cited : (15)

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