In the twilight zone of humidity testing

Test Engineering and Management

Volumn 72, Issue 4, 2010, Pages 8-9

  Kleyner, Andre ^a  

^a Delphi Electronics and Safety   (India)

Author keywords

[No Author keywords available]

Indexed keywords

CAPABILITY TEST; DENDRITIC GROWTH; DURABILITY TEST; ELECTRICAL PROPERTY; ENVIRONMENTAL CONDITIONS; ENVIRONMENTAL TEST; FAILURE MECHANISM; HARSH ENVIRONMENT; HIGH VOLTAGE; HUMIDITY TESTS; LOW CYCLE FATIGUES; SALT SPRAY; TWILIGHT ZONE; WEAR-OUT FAILURE;

CORROSION; CORROSION FATIGUE; DURABILITY; ENVIRONMENTAL TESTING; MATERIALS PROPERTIES; MECHANICAL PROPERTIES;

ELECTRIC PROPERTIES;

EID: 77957091698     PISSN: 01934120     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (2)

1. Ohring, M., "Reliability and Failure of Electronic Materials and Devices," Academic Press, 1998
2. Peck, D. S., "Comprehensive Model for HumidityTesting Correlation," IEEE IRPS Proceedings, 1986, pages 44-50.