Magnetic normal modes of elliptical NiFe nanoring studied by micro-focused Brillouin light scattering

Journal of Physics: Conference Series

Volumn 200, Issue SECTION 4, 2010, Pages

  Madami, M ^a   Tacchi, S ^a   Gubbiotti, G ^a   Carlotti, G ^a   Montoncello, F ^b   Capuzzo, G ^c   Nizzoli, F ^c  

^a UNIVERSITY OF PERUGIA   (Italy)

^b Dipartimento di Fisica   (Italy)

^c UNIVERSITY OF FERRARA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

LIGHT SCATTERING; NANORINGS; NANOSTRUCTURED MATERIALS;

BRILLOUIN LIGHT SCATTERING; LARGE ARRAYS; LOCALISED; MAGNETIC NORMAL MODES; MAGNETIZATION DYNAMICS; MICROMAGNETIC SIMULATIONS; NANOMAGNETS; SPATIAL SYMMETRY;

BRILLOUIN SCATTERING;

EID: 77957025292     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/200/4/042008     Document Type: Conference Paper

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5. The axial resolution (depth of focus) is a measurement of how much distance exists behind the objective wherein the sample will remain sharply in focus without loosing contrast
6. -13 J/m for the exchange stiffness constant)
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