n-Way Metrics

Journal of Classification

Volumn 27, Issue 2, 2010, Pages 173-190

  Warrens, Matthijs J ^a  

^a LEIDEN UNIVERSITY   (Netherlands)

Author keywords

n Way distance measure; Parametrized inequality; Tetrahedron inequality; Polyhedron inequality; Triangle inequality

Indexed keywords

EID: 77957021313     PISSN: 01764268     EISSN: 14321343     Source Type: Journal    
DOI: 10.1007/s00357-010-9052-x     Document Type: Article

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