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Volumn , Issue , 2010, Pages 205-208
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An adaptive SIW filter using vertically-orientated fluidic material perturbations
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTICAL MODELING;
BAND PASS;
DIELECTRIC NANOPARTICLES;
MEASURED DATA;
SIW FILTERS;
VERTICALLY ALIGNED;
BANDPASS FILTERS;
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EID: 77956979571
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/AHS.2010.5546259 Document Type: Conference Paper |
Times cited : (4)
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References (13)
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