-
1
-
-
0014589070
-
-
Abramson, N., Optik, 30, 1969, 56.
-
(1969)
Optik
, vol.30
, pp. 56
-
-
Abramson, N.1
-
2
-
-
84975576101
-
-
Ai, Ch., Wyant, J.C., Appl. Opt., 26, 1987, 1112.
-
(1987)
Appl. Opt.
, vol.26
, pp. 1112
-
-
Ai, C.1
Wyant, J.C.2
-
3
-
-
84975557386
-
-
Ai, Ch., Wyant, J.C., Appl. Opt., 27, 1988, 3039.
-
(1988)
Appl. Opt.
, vol.27
, pp. 3039
-
-
Ai, C.1
Wyant, J.C.2
-
4
-
-
0018204286
-
-
Augustyn, W.H., Rosenfeld, A.H., Zanoni, C.A., Proc. SPIE, 153, 1978, 146.
-
(1978)
Proc. SPIE
, vol.153
, pp. 146
-
-
Augustyn, W.H.1
Rosenfeld, A.H.2
Zanoni, C.A.3
-
5
-
-
85012787595
-
-
Balasumbramanian, N., Debell, G.W., Proc. SPIE, 230, 1980, 180.
-
(1980)
Proc. SPIE
, vol.230
, pp. 180
-
-
Balasumbramanian, N.1
Debell, G.W.2
-
7
-
-
0023344560
-
-
Becker, K., Heynacher, E., Feinwerktech. & Messtech., 95, 1987, 233.
-
(1987)
Feinwerktech. & Messtech.
, vol.95
, pp. 233
-
-
Becker, K.1
Heynacher, E.2
-
8
-
-
85012576162
-
-
Bhushan, B., Wyant, J.C., Koliopoulos, C.L., Appl. Opt., 24, 1985, 1984.
-
(1985)
Appl. Opt.
, vol.24
, pp. 1984
-
-
Bhushan, B.1
Wyant, J.C.2
Koliopoulos, C.L.3
-
10
-
-
85012599515
-
-
Conf. Report: Laser 87, München, ed. W. Waidelich (Springer, Berlin).
-
Biedermann, K. 1987 Optoelektronik in der Technik, Conf. Report: Laser 87, München, ed. W. Waidelich (Springer, Berlin).
-
(1987)
Optoelektronik in der Technik
-
-
Biedermann, K.1
-
11
-
-
85012738501
-
-
Birch, K.G., Jackson, K., Pugh, D.J., West, P.D., Proc. SPIE, 369, 1982, 186.
-
(1982)
Proc. SPIE
, vol.369
, pp. 186
-
-
Birch, K.G.1
Jackson, K.2
Pugh, D.J.3
West, P.D.4
-
12
-
-
0000682663
-
-
Bone, D.J., Bachor, H.-A., Sandemann, R.J., Appl. Opt., 25, 1986, 1653.
-
(1986)
Appl. Opt.
, vol.25
, pp. 1653
-
-
Bone, D.J.1
Bachor, H.-A.2
Sandemann, R.J.3
-
13
-
-
0023961045
-
-
Bonkhofer, T., Kuehlke, D., von der Linde, D., Opt. Commun., 65, 1988, 167.
-
(1988)
Opt. Commun.
, vol.65
, pp. 167
-
-
Bonkhofer, T.1
Kuehlke, D.2
von der Linde, D.3
-
14
-
-
0003972070
-
-
2nd Ed. Pergamon Press Oxford
-
Born, M., Wolf, E., Principles of Optics, 2nd Ed., 1964, Pergamon Press, Oxford.
-
(1964)
Principles of Optics
-
-
Born, M.1
Wolf, E.2
-
15
-
-
0021804413
-
-
Breuckmann, B., Thieme, W., Appl. Opt., 24, 1985, 2145.
-
(1985)
Appl. Opt.
, vol.24
, pp. 2145
-
-
Breuckmann, B.1
Thieme, W.2
-
16
-
-
0001844416
-
Fringe Scanning Interferometers
-
D. Malacara Wiley New York ch. 13
-
Bruning, J.H., Fringe Scanning Interferometers. Malacara, D., (eds.) Optical Shop Testing, 1978, Wiley, New York ch. 13.
-
(1978)
Optical Shop Testing
-
-
Bruning, J.H.1
-
17
-
-
0016128770
-
-
Bruning, J.H., Herriott, D.R., Gallagher, J.E., Rosenfeld, D.P., White, A.D., Brangaccio, D.J., Appl. Opt., 13, 1974, 2693.
-
(1974)
Appl. Opt.
, vol.13
, pp. 2693
-
-
Bruning, J.H.1
Herriott, D.R.2
Gallagher, J.E.3
Rosenfeld, D.P.4
White, A.D.5
Brangaccio, D.J.6
-
18
-
-
85012591798
-
-
Budiansky, M.P., Nelson, J.E., Proc. SPIE, 450, 1983, 59.
-
(1983)
Proc. SPIE
, vol.450
, pp. 59
-
-
Budiansky, M.P.1
Nelson, J.E.2
-
19
-
-
0342329056
-
-
Burger, H.C., van Cittert, P.H., Z. Phys., 79, 1932, 722.
-
(1932)
Z. Phys.
, vol.79
, pp. 722
-
-
Burger, H.C.1
van Cittert, P.H.2
-
21
-
-
77949765798
-
-
Chen, Ch., Maimon, P., Proc. SPIE, 316, 1981, 9.
-
(1981)
Proc. SPIE
, vol.316
, pp. 9
-
-
Chen, C.1
Maimon, P.2
-
22
-
-
84925486651
-
-
Cheng, Y.-Y., Wyant, J.C., Appl. Opt., 23, 1984, 4539.
-
(1984)
Appl. Opt.
, vol.23
, pp. 4539
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
23
-
-
0022001763
-
-
Cheng, Y.-Y., Wyant, J.C., Appl. Opt., 24, 1985, 804.
-
(1985)
Appl. Opt.
, vol.24
, pp. 804
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
24
-
-
84975603082
-
-
Cheng, Y.-Y., Wyant, J.C., Appl. Opt., 24, 1985, 3049.
-
(1985)
Appl. Opt.
, vol.24
, pp. 3049
-
-
Cheng, Y.-Y.1
Wyant, J.C.2
-
25
-
-
0020098542
-
-
Cline, T.W., Jander, R.B., Appl. Opt., 21, 1982, 1035.
-
(1982)
Appl. Opt.
, vol.21
, pp. 1035
-
-
Cline, T.W.1
Jander, R.B.2
-
26
-
-
85012660566
-
-
Cooley, J.W., Tuckey, J.W., Math. Comput., 19, 1965, 297.
-
(1965)
Math. Comput.
, vol.19
, pp. 297
-
-
Cooley, J.W.1
Tuckey, J.W.2
-
31
-
-
77956978378
-
Phase-Measurement Interferometry Techniques
-
E. Wolf North-Holland Amsterdam
-
Creath, K., Phase-Measurement Interferometry Techniques. Wolf, E., (eds.) Progress in Optics, 1988, North-Holland, Amsterdam, 349–393.
-
(1988)
Progress in Optics
, pp. 349-393
-
-
Creath, K.1
-
32
-
-
84975574677
-
-
Creath, K., Slettemoen, G.A., J. Opt. Soc. Am. A, 2, 1985, 1629.
-
(1985)
J. Opt. Soc. Am. A
, vol.2
, pp. 1629
-
-
Creath, K.1
Slettemoen, G.A.2
-
33
-
-
84947820959
-
-
Creath, K., Cheng, Y.-Y., Wyant, J.C., Opt. Acta, 32, 1985, 1455.
-
(1985)
Opt. Acta
, vol.32
, pp. 1455
-
-
Creath, K.1
Cheng, Y.-Y.2
Wyant, J.C.3
-
34
-
-
84975541779
-
-
Crescentini, L., Fiocco, G., Appl. Opt., 27, 1988, 118.
-
(1988)
Appl. Opt.
, vol.27
, pp. 118
-
-
Crescentini, L.1
Fiocco, G.2
-
35
-
-
0346041306
-
Heterodyne Holographic Interferometry
-
E. Wolf North-Holland Amsterdam ch. I
-
Daendliker, R., Heterodyne Holographic Interferometry. Wolf, E., (eds.) Progress in Optics, 17, 1980, North-Holland, Amsterdam ch. I.
-
(1980)
Progress in Optics
, vol.17
-
-
Daendliker, R.1
-
36
-
-
85037346124
-
-
Daendliker, R., Ineichen, B., Proc. SPIE, 99, 1977, 90.
-
(1977)
Proc. SPIE
, vol.99
, pp. 90
-
-
Daendliker, R.1
Ineichen, B.2
-
37
-
-
0022130590
-
-
Daendliker, R., Thalmann, R., Opt. Eng., 24, 1985, 824.
-
(1985)
Opt. Eng.
, vol.24
, pp. 824
-
-
Daendliker, R.1
Thalmann, R.2
-
38
-
-
84975589602
-
-
Daendliker, R., Thalmann, R., Prongue, D., Opt. Lett., 13, 1988, 339.
-
(1988)
Opt. Lett.
, vol.13
, pp. 339
-
-
Daendliker, R.1
Thalmann, R.2
Prongue, D.3
-
39
-
-
85012602587
-
-
NPL op Met 1.
-
Dew, G. D. 1967 NPL op Met 1.
-
(1967)
-
-
Dew, G.D.1
-
40
-
-
0020020399
-
-
Doerband, B., Optik, 60, 1982, 161.
-
(1982)
Optik
, vol.60
, pp. 161
-
-
Doerband, B.1
-
41
-
-
0022256123
-
-
Doerband, B., Tiziani, H.J., Appl. Opt., 24, 1985, 2604.
-
(1985)
Appl. Opt.
, vol.24
, pp. 2604
-
-
Doerband, B.1
Tiziani, H.J.2
-
48
-
-
84975593556
-
-
Physikalische Gesellschaft der DDR Berlin
-
Elssner, K.-E., Wallburg, S., Beiträge zur Optik und Quantenelektronik, 7, 1982, Physikalische Gesellschaft der DDR, Berlin, 142.
-
(1982)
Beiträge zur Optik und Quantenelektronik
, vol.7
, pp. 142
-
-
Elssner, K.-E.1
Wallburg, S.2
-
49
-
-
84863758279
-
-
Elssner, K.-E., Burow, R., Grzanna, J., Spolaczyk, R., Appl. Opt., 28, 1989, 4649.
-
(1989)
Appl. Opt.
, vol.28
, pp. 4649
-
-
Elssner, K.-E.1
Burow, R.2
Grzanna, J.3
Spolaczyk, R.4
-
51
-
-
85012677492
-
-
Erler, K., Wenke, L., Schreiber, W., Feingerätetechnik, 29, 1980, 510.
-
(1980)
Feingerätetechnik
, vol.29
, pp. 510
-
-
Erler, K.1
Wenke, L.2
Schreiber, W.3
-
53
-
-
0022711396
-
-
Fercher, A.F., Vry, U., Opt. Eng., 25, 1986, 623.
-
(1986)
Opt. Eng.
, vol.25
, pp. 623
-
-
Fercher, A.F.1
Vry, U.2
-
55
-
-
85012746690
-
-
Freitag, W., Grossmann, W., Tandler, H., Feingerätetechnik, 18, 1979, 247.
-
(1979)
Feingerätetechnik
, vol.18
, pp. 247
-
-
Freitag, W.1
Grossmann, W.2
Tandler, H.3
-
59
-
-
84948057949
-
-
P. Mollet Pergamon Press Oxford
-
Gates, J.W., Mollet, P., (eds.) Optics in Metrology, 1958, Pergamon Press, Oxford, 201.
-
(1958)
Optics in Metrology
, pp. 201
-
-
Gates, J.W.1
-
60
-
-
84975581487
-
-
George, N., Stone, T., Proc. SPIE, 883, 1988, 196.
-
(1988)
Proc. SPIE
, vol.883
, pp. 196
-
-
George, N.1
Stone, T.2
-
61
-
-
84975587043
-
-
Ghiglia, D.C., Mastin, G.A., Romero, L.A., J. Opt. Soc. Am. A, 4, 1987, 267.
-
(1987)
J. Opt. Soc. Am. A
, vol.4
, pp. 267
-
-
Ghiglia, D.C.1
Mastin, G.A.2
Romero, L.A.3
-
64
-
-
0037968374
-
-
Grosso, R.P., Crane, R., Proc. SPIE, 192, 1979, 65.
-
(1979)
Proc. SPIE
, vol.192
, pp. 65
-
-
Grosso, R.P.1
Crane, R.2
-
65
-
-
84915312695
-
-
Grzanna, J., Burow, R., Schulz, G., Vogel, A., Beitr. Optik und Quantenelektronik (Phys. Ges. DDR, Berlin, 13, 1988, 93.
-
(1988)
Beitr. Optik und Quantenelektronik (Phys. Ges. DDR, Berlin
, vol.13
, pp. 93
-
-
Grzanna, J.1
Burow, R.2
Schulz, G.3
Vogel, A.4
-
68
-
-
77956979218
-
Interferometry with Lasers
-
E. Wolf North-Holland Amsterdam
-
Hariharan, P., Interferometry with Lasers. Wolf, E., (eds.) Progress in Optics, 24, 1987, North-Holland, Amsterdam.
-
(1987)
Progress in Optics
, vol.24
-
-
Hariharan, P.1
-
69
-
-
0021427913
-
-
Hariharan, P., Oreb, B.F., Opt. Eng., 23, 1984, 294.
-
(1984)
Opt. Eng.
, vol.23
, pp. 294
-
-
Hariharan, P.1
Oreb, B.F.2
-
70
-
-
0020128359
-
-
Hariharan, P., Oreb, B.F., Brown, N., Opt. Commun., 41, 1982, 393.
-
(1982)
Opt. Commun.
, vol.41
, pp. 393
-
-
Hariharan, P.1
Oreb, B.F.2
Brown, N.3
-
71
-
-
0020720981
-
-
Hariharan, P., Oreb, B.F., Brown, N., Appl. Opt., 22, 1983, 876.
-
(1983)
Appl. Opt.
, vol.22
, pp. 876
-
-
Hariharan, P.1
Oreb, B.F.2
Brown, N.3
-
72
-
-
84891690591
-
-
Hariharan, P., Oreb, B.F., Freund, C.H., Appl. Opt., 26, 1987, 3899.
-
(1987)
Appl. Opt.
, vol.26
, pp. 3899
-
-
Hariharan, P.1
Oreb, B.F.2
Freund, C.H.3
-
73
-
-
85012606007
-
-
Harris, J.H., Hopkins, H.H., Appl. Opt., 18, 1979, 2375.
-
(1979)
Appl. Opt.
, vol.18
, pp. 2375
-
-
Harris, J.H.1
Hopkins, H.H.2
-
75
-
-
0020870068
-
-
Hayes, J., Lange, S., Proc. SPIE, 429, 1983, 22.
-
(1983)
Proc. SPIE
, vol.429
, pp. 22
-
-
Hayes, J.1
Lange, S.2
-
80
-
-
85012664557
-
-
Hot, J.P., Durou, C., Proc. SPIE, 210, 1979, 144.
-
(1979)
Proc. SPIE
, vol.210
, pp. 144
-
-
Hot, J.P.1
Durou, C.2
-
81
-
-
84975568513
-
-
Hu, H.Z., Appl. Opt., 22, 1983, 2052.
-
(1983)
Appl. Opt.
, vol.22
, pp. 2052
-
-
Hu, H.Z.1
-
83
-
-
0018520198
-
-
Hugenholtz, C.A.J., Meddens, B.J.H., Rev. Sci. Instrum., 50, 1979, 1123.
-
(1979)
Rev. Sci. Instrum.
, vol.50
, pp. 1123
-
-
Hugenholtz, C.A.J.1
Meddens, B.J.H.2
-
86
-
-
84975574722
-
-
Ichikawa, K., Lohmann, A.W., Takeda, M., Appl. Opt., 27, 1988, 3433.
-
(1988)
Appl. Opt.
, vol.27
, pp. 3433
-
-
Ichikawa, K.1
Lohmann, A.W.2
Takeda, M.3
-
87
-
-
0015373101
-
-
Ichioka, Y., Inuiya, M., Appl. Opt., 11, 1972, 1507.
-
(1972)
Appl. Opt.
, vol.11
, pp. 1507
-
-
Ichioka, Y.1
Inuiya, M.2
-
88
-
-
84921117242
-
Accuracy and reproducibility of heterodyne holographic interferometry
-
E. Marom A.A. Friesem E. Wiener-Avnear Pergamon Press Oxford
-
Ineichen, B., Daendliker, R., Mastner, J., Accuracy and reproducibility of heterodyne holographic interferometry. Marom, E., Friesem, A.A., Wiener-Avnear, E., (eds.) Applications of Holography and Optical Data Processing, 1977, Pergamon Press, Oxford, 207–212.
-
(1977)
Applications of Holography and Optical Data Processing
, pp. 207-212
-
-
Ineichen, B.1
Daendliker, R.2
Mastner, J.3
-
89
-
-
0000186699
-
-
Itoh, K., Appl. Opt., 21, 1982, 2470.
-
(1982)
Appl. Opt.
, vol.21
, pp. 2470
-
-
Itoh, K.1
-
91
-
-
84957467913
-
-
Johnson, G.W., Moore, D.T., Proc. SPIE, 103, 1977, 76.
-
(1977)
Proc. SPIE
, vol.103
, pp. 76
-
-
Johnson, G.W.1
Moore, D.T.2
-
93
-
-
69049121214
-
-
Jones, R.A., Kadakia, P.L., Appl. Opt., 7, 1968, 1477.
-
(1968)
Appl. Opt.
, vol.7
, pp. 1477
-
-
Jones, R.A.1
Kadakia, P.L.2
-
96
-
-
84975629121
-
-
Kikuta, H., Iwata, K., Nagata, R., Appl. Opt., 25, 1986, 2976.
-
(1986)
Appl. Opt.
, vol.25
, pp. 2976
-
-
Kikuta, H.1
Iwata, K.2
Nagata, R.3
-
97
-
-
84975586767
-
-
Kikuta, H., Iwata, K., Nagata, R., Appl. Opt., 26, 1987, 1654.
-
(1987)
Appl. Opt.
, vol.26
, pp. 1654
-
-
Kikuta, H.1
Iwata, K.2
Nagata, R.3
-
98
-
-
84975606596
-
-
Kinnstaetter, K., Lohmann, A.W., Schwider, J., Streibl, N., Appl. Opt., 27, 1988, 5082.
-
(1988)
Appl. Opt.
, vol.27
, pp. 5082
-
-
Kinnstaetter, K.1
Lohmann, A.W.2
Schwider, J.3
Streibl, N.4
-
99
-
-
84889538855
-
-
Kist, R., Kersten, R.Th., Laser & Optoelektronik, 16(1), 1984, 17.
-
(1984)
Laser & Optoelektronik
, vol.16
, Issue.1
, pp. 17
-
-
Kist, R.1
Kersten, R.T.2
-
105
-
-
85012799901
-
-
paper IV ThB 1–1, held at the Optical Fabrication and Testing Workshop, 21–23.10.86, Seattle, Washington.
-
Kuechel, F. M. 1986 paper IV ThB 1–1, held at the Optical Fabrication and Testing Workshop, 21–23.10.86, Seattle, Washington.
-
(1986)
-
-
Kuechel, F.M.1
-
106
-
-
85012595496
-
-
paper held on the ESO-Conference on Very Large Telescopes and their Instrumentation, Garching, 21–24 March.
-
Kuechel, F. M., E. Heynacher 1988 paper held on the ESO-Conference on Very Large Telescopes and their Instrumentation, Garching, 21–24 March.
-
(1988)
-
-
Kuechel, F.M.1
Heynacher, E.2
-
107
-
-
84975597789
-
-
Kujawinska, M., Robinson, D.W., Appl. Opt., 27, 1988, 312.
-
(1988)
Appl. Opt.
, vol.27
, pp. 312
-
-
Kujawinska, M.1
Robinson, D.W.2
-
109
-
-
0001128314
-
-
Kwon, O.Y., Shough, D.M., Proc. SPIE, 555, 1985, 273.
-
(1985)
Proc. SPIE
, vol.555
, pp. 273
-
-
Kwon, O.Y.1
Shough, D.M.2
-
110
-
-
84975635787
-
-
Kwon, O.Y., Shough, D.M., Williams, R.A., Opt. Lett., 12, 1987, 855.
-
(1987)
Opt. Lett.
, vol.12
, pp. 855
-
-
Kwon, O.Y.1
Shough, D.M.2
Williams, R.A.3
-
111
-
-
84975575683
-
-
Laeri, F., Strand, T.C., Appl. Opt., 26, 1987, 2245.
-
(1987)
Appl. Opt.
, vol.26
, pp. 2245
-
-
Laeri, F.1
Strand, T.C.2
-
113
-
-
84957519876
-
-
Lanzl, F., Schlueter, M., Proc. SPIE, 136, 1978, 166.
-
(1978)
Proc. SPIE
, vol.136
, pp. 166
-
-
Lanzl, F.1
Schlueter, M.2
-
115
-
-
85012652804
-
-
Lavan, M.J., van Damme, G.E., Cadwallender, W.K., Deyoung, T.F., JTEVA, 5, 1977, 382.
-
(1977)
JTEVA
, vol.5
, pp. 382
-
-
Lavan, M.J.1
van Damme, G.E.2
Cadwallender, W.K.3
Deyoung, T.F.4
-
116
-
-
0021785329
-
-
Lee, P., Bartlett, R.J., Kania, D.R., Opt. Eng., 24, 1985, 197.
-
(1985)
Opt. Eng.
, vol.24
, pp. 197
-
-
Lee, P.1
Bartlett, R.J.2
Kania, D.R.3
-
117
-
-
0018059104
-
-
Leiner, D.C., Moore, D.T., Rev. Sci. Instrum., 49, 1978, 1702.
-
(1978)
Rev. Sci. Instrum.
, vol.49
, pp. 1702
-
-
Leiner, D.C.1
Moore, D.T.2
-
118
-
-
85012592775
-
-
NPL Report MOM 68.
-
Liu, R., K. G. Birch 1984 NPL Report MOM 68.
-
(1984)
-
-
Liu, R.1
Birch, K.G.2
-
119
-
-
85168354575
-
A Computer Program for Analysis of Interferometric Data
-
A.H. Guenther D.H. Liebenberg ASTM Philadelphia, PA
-
Loomis, J.S., A Computer Program for Analysis of Interferometric Data. Guenther, A.H., Liebenberg, D.H., (eds.) Optical Interferograms - Reduction and Interpretation, 1978, ASTM, Philadelphia, PA, 71.
-
(1978)
Optical Interferograms - Reduction and Interpretation
, pp. 71
-
-
Loomis, J.S.1
-
120
-
-
0015027523
-
-
MacGovern, A.J., Wyant, J.C., Appl. Opt., 10, 1971, 619.
-
(1971)
Appl. Opt.
, vol.10
, pp. 619
-
-
MacGovern, A.J.1
Wyant, J.C.2
-
121
-
-
0020940715
-
-
Macy, W., Appl. Opt., 22, 1983, 3898.
-
(1983)
Appl. Opt.
, vol.22
, pp. 3898
-
-
Macy, W.1
-
122
-
-
84957532111
-
-
Mahany, R., Buzawa, M., Proc. SPIE, 192, 1979, 50.
-
(1979)
Proc. SPIE
, vol.192
, pp. 50
-
-
Mahany, R.1
Buzawa, M.2
-
123
-
-
0042909931
-
-
Makosch, G., Solf, B., Proc. SPIE, 316, 1981, 42.
-
(1981)
Proc. SPIE
, vol.316
, pp. 42
-
-
Makosch, G.1
Solf, B.2
-
124
-
-
0022217348
-
-
Malacara, D., Menchaca, C., Proc. SPIE, 540, 1985, 34.
-
(1985)
Proc. SPIE
, vol.540
, pp. 34
-
-
Malacara, D.1
Menchaca, C.2
-
126
-
-
0019026927
-
-
Marcuse, D., Presby, H., Proc. IEEE, 68, 1980, 666.
-
(1980)
Proc. IEEE
, vol.68
, pp. 666
-
-
Marcuse, D.1
Presby, H.2
-
129
-
-
0018481120
-
-
Massie, N.A., Nelson, R.D., Holly, S., Appl. Opt., 18, 1979, 1797.
-
(1979)
Appl. Opt.
, vol.18
, pp. 1797
-
-
Massie, N.A.1
Nelson, R.D.2
Holly, S.3
-
130
-
-
84975624462
-
-
Mastin, G.A., Ghiglia, D.C., Appl. Opt., 24, 1985, 1727.
-
(1985)
Appl. Opt.
, vol.24
, pp. 1727
-
-
Mastin, G.A.1
Ghiglia, D.C.2
-
131
-
-
0019033933
-
-
Mastner, J., Masek, V., Rev. Sci. Instrum., 51, 1980, 926.
-
(1980)
Rev. Sci. Instrum.
, vol.51
, pp. 926
-
-
Mastner, J.1
Masek, V.2
-
133
-
-
85012612269
-
-
Merkel, K., Giggel, V., Elssner, K.-E., Spolaczyk, R., Feingerätetechnik, 37, 1988, 345.
-
(1988)
Feingerätetechnik
, vol.37
, pp. 345
-
-
Merkel, K.1
Giggel, V.2
Elssner, K.-E.3
Spolaczyk, R.4
-
135
-
-
0018305840
-
-
Moore, D.T., Truax, B.E., Appl. Opt., 18, 1979, 91.
-
(1979)
Appl. Opt.
, vol.18
, pp. 91
-
-
Moore, D.T.1
Truax, B.E.2
-
136
-
-
0018111180
-
-
Moore, D.T., Murray, R., Neves, F.B., Appl. Opt., 17, 1978, 3959.
-
(1978)
Appl. Opt.
, vol.17
, pp. 3959
-
-
Moore, D.T.1
Murray, R.2
Neves, F.B.3
-
137
-
-
0019289563
-
-
Moore, R., Slaymaker, F., Proc. SPIE, 220, 1980, 75.
-
(1980)
Proc. SPIE
, vol.220
, pp. 75
-
-
Moore, R.1
Slaymaker, F.2
-
138
-
-
0020843158
-
-
Morris, M.B., McIlrath, T.J., Snyder, J.J., Appl. Opt., 23, 1984, 3862.
-
(1984)
Appl. Opt.
, vol.23
, pp. 3862
-
-
Morris, M.B.1
McIlrath, T.J.2
Snyder, J.J.3
-
139
-
-
0003952728
-
-
McGraw-Hill New York
-
Morse, P., Feshbach, H., Methods of Theoretical Physics, 1953, McGraw-Hill, New York, 454.
-
(1953)
Methods of Theoretical Physics
, pp. 454
-
-
Morse, P.1
Feshbach, H.2
-
141
-
-
0000353197
-
-
Nakadate, S., Saito, H., Appl. Opt., 24, 1985, 2172.
-
(1985)
Appl. Opt.
, vol.24
, pp. 2172
-
-
Nakadate, S.1
Saito, H.2
-
142
-
-
0019026885
-
-
Nakadate, S., Yatagai, T., Saito, H., Appl. Opt., 19, 1980, 1879.
-
(1980)
Appl. Opt.
, vol.19
, pp. 1879
-
-
Nakadate, S.1
Yatagai, T.2
Saito, H.3
-
143
-
-
0019541202
-
-
Nakadate, S., Magome, N., Honda, T., Tsujiuchi, J., Opt. Eng., 20, 1981, 246.
-
(1981)
Opt. Eng.
, vol.20
, pp. 246
-
-
Nakadate, S.1
Magome, N.2
Honda, T.3
Tsujiuchi, J.4
-
144
-
-
0020602329
-
-
Nakadate, S., Yatagai, T., Saito, H., Appl. Opt., 22, 1983, 237.
-
(1983)
Appl. Opt.
, vol.22
, pp. 237
-
-
Nakadate, S.1
Yatagai, T.2
Saito, H.3
-
146
-
-
0023519175
-
-
Osten, W., Saedler, J., Rottenkolber, H., Techn. Messen tm, 54, 1987, 285.
-
(1987)
Techn. Messen tm
, vol.54
, pp. 285
-
-
Osten, W.1
Saedler, J.2
Rottenkolber, H.3
-
147
-
-
0004246176
-
-
Springer Berlin
-
Ostrovsky, Yu.I., Butusov, M.M., Ostrovskaya, G.V., Interferometry by holography, Springer Series in Optical Sciences, 20, 1980, Springer, Berlin.
-
(1980)
Interferometry by holography, Springer Series in Optical Sciences
, vol.20
-
-
Ostrovsky, Y.I.1
Butusov, M.M.2
Ostrovskaya, G.V.3
-
150
-
-
84975534519
-
-
Pantzer, D., Politch, J., Ek, L., Appl. Opt., 25, 1986, 4168.
-
(1986)
Appl. Opt.
, vol.25
, pp. 4168
-
-
Pantzer, D.1
Politch, J.2
Ek, L.3
-
153
-
-
0020134465
-
-
Post, D., Opt. Eng., 21, 1982, 458.
-
(1982)
Opt. Eng.
, vol.21
, pp. 458
-
-
Post, D.1
-
154
-
-
0017946743
-
-
Presby, H.M., Astle, H.W., Rev. Sci. Instrum., 49, 1978, 339.
-
(1978)
Rev. Sci. Instrum.
, vol.49
, pp. 339
-
-
Presby, H.M.1
Astle, H.W.2
-
157
-
-
0001433101
-
-
Ransom, P.L., Kokal, J.V., Appl. Opt., 25, 1986, 4199.
-
(1986)
Appl. Opt.
, vol.25
, pp. 4199
-
-
Ransom, P.L.1
Kokal, J.V.2
-
160
-
-
0021580557
-
-
Dec.
-
Reid, G.T., Rixon, R.C., Messer, H.I., Opt. & Laser Technol., 84, 1984, 315 Dec.
-
(1984)
Opt. & Laser Technol.
, vol.84
, pp. 315
-
-
Reid, G.T.1
Rixon, R.C.2
Messer, H.I.3
-
162
-
-
84975587053
-
-
Roddier, C., Roddier, F., Appl. Opt., 26, 1987, 1668.
-
(1987)
Appl. Opt.
, vol.26
, pp. 1668
-
-
Roddier, C.1
Roddier, F.2
-
164
-
-
29344465502
-
-
A.H. Guenther D.H. Liebenberg ASTM Philadelphia, PA
-
Rosenzweig, D., Alte, B., Guenther, A.H., Liebenberg, D.H., (eds.) Optical Interferograms - Reduction and Interpretation, 1978, ASTM, Philadelphia, PA.
-
(1978)
Optical Interferograms - Reduction and Interpretation
-
-
Rosenzweig, D.1
Alte, B.2
-
165
-
-
0023995081
-
-
Ru, Q.-S., Honda, T., Tsujiuchi, J., Ohyama, N., Opt. Commun., 66, 1988, 21.
-
(1988)
Opt. Commun.
, vol.66
, pp. 21
-
-
Ru, Q.-S.1
Honda, T.2
Tsujiuchi, J.3
Ohyama, N.4
-
166
-
-
69949166537
-
-
Sasaki, O., Okazaki, H., Appl. Opt., 25, 1986, 3137.
-
(1986)
Appl. Opt.
, vol.25
, pp. 3137
-
-
Sasaki, O.1
Okazaki, H.2
-
167
-
-
0001265086
-
-
Sasaki, O., Okazaki, H., Appl. Opt., 25, 1986, 3152.
-
(1986)
Appl. Opt.
, vol.25
, pp. 3152
-
-
Sasaki, O.1
Okazaki, H.2
-
168
-
-
84975576355
-
-
Sasaki, O., Okazaki, H., Sakai, M., Appl. Opt., 26, 1987, 1089.
-
(1987)
Appl. Opt.
, vol.26
, pp. 1089
-
-
Sasaki, O.1
Okazaki, H.2
Sakai, M.3
-
169
-
-
85012576642
-
-
25th Annual International Technical Symposium of the SPIE, 24.-28.8.81, San Diego.
-
Schaham, M. 1981 25th Annual International Technical Symposium of the SPIE, 24.-28.8.81, San Diego.
-
(1981)
-
-
Schaham, M.1
-
173
-
-
0016892621
-
Interferometric Testing of Smooth Surfaces
-
E. Wolf North-Holland Amsterdam ch. IV
-
Schulz, G., Schwider, J., Interferometric Testing of Smooth Surfaces. Wolf, E., (eds.) Progress in Optics, 13, 1976, North-Holland, Amsterdam ch. IV.
-
(1976)
Progress in Optics
, vol.13
-
-
Schulz, G.1
Schwider, J.2
-
174
-
-
0015039875
-
-
Schulz, G., Schwider, J., Hiller, C., Kicker, B., Appl. Opt., 10, 1971, 929.
-
(1971)
Appl. Opt.
, vol.10
, pp. 929
-
-
Schulz, G.1
Schwider, J.2
Hiller, C.3
Kicker, B.4
-
176
-
-
85012641449
-
-
Absolute Ebenheitsprufung aus interferentiellen Relativmessungen zwischen 3 Planflachen, Dissertation (Humboldt-Universität, Berlin).
-
Schwider, J. 1966 Absolute Ebenheitsprufung aus interferentiellen Relativmessungen zwischen 3 Planflachen, Dissertation (Humboldt-Universität, Berlin).
-
(1966)
-
-
Schwider, J.1
-
180
-
-
85012585717
-
Recent Advances in Optical Physics
-
eds B. Havelka, J. Blabla (Prague).
-
Schwider, J., R. Burow 1975 Recent Advances in Optical Physics, Proc. of ICO-10, eds B. Havelka, J. Blabla (Prague) p. 471.
-
(1975)
Proc. of ICO-10
, pp. 471
-
-
Schwider, J.1
Burow, R.2
-
181
-
-
0010720442
-
-
Schwider, J., Schulz, G., Riekher, R., Minkwitz, G., Opt. Acta, 13, 1966, 103.
-
(1966)
Opt. Acta
, vol.13
, pp. 103
-
-
Schwider, J.1
Schulz, G.2
Riekher, R.3
Minkwitz, G.4
-
182
-
-
0020844269
-
-
Schwider, J., Burow, R., Elssner, K.-E., Grzanna, J., Spolaczyk, R., Merkel, K., Appl. Opt., 21, 1983, 3421.
-
(1983)
Appl. Opt.
, vol.21
, pp. 3421
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
Merkel, K.6
-
183
-
-
85012655553
-
-
Schwider, J., Burow, R., Elssner, K.-E., Foellmer, K., Grzanna, J., Spolaczyk, R., Wallburg, S., Merkel, K., Opt. Acta, 15, 1985, 395.
-
(1985)
Opt. Acta
, vol.15
, pp. 395
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Foellmer, K.4
Grzanna, J.5
Spolaczyk, R.6
Wallburg, S.7
Merkel, K.8
-
184
-
-
85012625132
-
-
X. Imeko World Congress Prague Preprint
-
Schwider, J., Elssner, K.-E., Grzanna, J., Spolaczyk, R., Imeko, X., (eds.) Absolute Calibration in Real-Time Interferometry, 3, 1985, World Congress, Prague, 302 Preprint.
-
(1985)
Absolute Calibration in Real-Time Interferometry
, vol.3
, pp. 302
-
-
Schwider, J.1
Elssner, K.-E.2
Grzanna, J.3
Spolaczyk, R.4
-
185
-
-
84975625095
-
-
Schwider, J., Burow, R., Elssner, K.-E., Spolaczyk, R., Grzanna, J., Appl. Opt., 24, 1985, 3059.
-
(1985)
Appl. Opt.
, vol.24
, pp. 3059
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Spolaczyk, R.4
Grzanna, J.5
-
186
-
-
0141766067
-
-
Schwider, J., Elssner, K.-E., Spolaczyk, R., Merkel, K., Appl. Opt., 15, 1985, 255.
-
(1985)
Appl. Opt.
, vol.15
, pp. 255
-
-
Schwider, J.1
Elssner, K.-E.2
Spolaczyk, R.3
Merkel, K.4
-
187
-
-
84975625172
-
-
Schwider, J., Burow, R., Elssner, K.-E., Grzanna, J., Spolaczyk, R., Appl. Opt., 25, 1986, 1117.
-
(1986)
Appl. Opt.
, vol.25
, pp. 1117
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
-
188
-
-
85012776551
-
-
Proceedings IMEKO TC14 Laser Measurement Working Group Symposium, November 1986, Budapest, eds T. Kemeny, K. Havrilla Nova Science, Commack, NY.
-
Schwider, J., R. Burow, K.-E. Elssner, J. Grzanna, R. Spolaczyk 1987 Automatic Frozen Fringe Analysis, Proceedings IMEKO TC14 Laser Measurement Working Group Symposium, November 1986, Budapest, eds T. Kemeny, K. Havrilla Nova Science, Commack, NY p. 227.
-
(1987)
Automatic Frozen Fringe Analysis
, pp. 227
-
-
Schwider, J.1
Burow, R.2
Elssner, K.-E.3
Grzanna, J.4
Spolaczyk, R.5
-
189
-
-
85012690508
-
-
Proceedings IMEKO TC14 Laser Measurement Working Group Symposium, November 1986, Budapest, eds T. Kemeny, K. Havrilla (Nova Science, Commack, NY).
-
Schwider, J., K. E. Elssner, J. Grzanna, R. Spolaczyk 1987 Results and error sources in absolute sphericity measurement, Proceedings IMEKO TC14 Laser Measurement Working Group Symposium, November 1986, Budapest, eds T. Kemeny, K. Havrilla (Nova Science, Commack, NY) p. 93.
-
(1987)
Results and error sources in absolute sphericity measurement
, pp. 93
-
-
Schwider, J.1
Elssner, K.E.2
Grzanna, J.3
Spolaczyk, R.4
-
190
-
-
84975568612
-
-
Slettemoen, G.A., Wyant, J.C., J. Opt. Soc. Am. A, 3, 1986, 210.
-
(1986)
J. Opt. Soc. Am. A
, vol.3
, pp. 210
-
-
Slettemoen, G.A.1
Wyant, J.C.2
-
192
-
-
0001284821
-
-
Smartt, R.N., Strong, J., J. Opt. Soc. Am., 62, 1972, 737.
-
(1972)
J. Opt. Soc. Am.
, vol.62
, pp. 737
-
-
Smartt, R.N.1
Strong, J.2
-
193
-
-
0020903504
-
-
Smythe, R., Moore, R., Proc. SPIE, 429, 1983, 16.
-
(1983)
Proc. SPIE
, vol.429
, pp. 16
-
-
Smythe, R.1
Moore, R.2
-
197
-
-
85012668399
-
-
Spolaczyk, R., Adamsberger, K., Schwider, J., Feingerätetechnik, 28, 1979, 381.
-
(1979)
Feingerätetechnik
, vol.28
, pp. 381
-
-
Spolaczyk, R.1
Adamsberger, K.2
Schwider, J.3
-
198
-
-
0021494190
-
-
Srinivasan, V., Liu, H.C., Halioua, M., Appl. Opt., 23, 1984, 3105.
-
(1984)
Appl. Opt.
, vol.23
, pp. 3105
-
-
Srinivasan, V.1
Liu, H.C.2
Halioua, M.3
-
199
-
-
84975598554
-
-
Stetson, K.A., Brohinsky, W.R., Appl. Opt., 24, 1985, 3631.
-
(1985)
Appl. Opt.
, vol.24
, pp. 3631
-
-
Stetson, K.A.1
Brohinsky, W.R.2
-
200
-
-
84907484322
-
-
Stetson, K.A., Brohinsky, W.R., Appl. Opt., 25, 1986, 2643.
-
(1986)
Appl. Opt.
, vol.25
, pp. 2643
-
-
Stetson, K.A.1
Brohinsky, W.R.2
-
201
-
-
0023670398
-
-
Stolen, R.H., De Paula, R., Proc. IEEE, 75, 1987, 1498.
-
(1987)
Proc. IEEE
, vol.75
, pp. 1498
-
-
Stolen, R.H.1
De Paula, R.2
-
202
-
-
1342311823
-
-
Strand, T.C., Katzir, Y., Appl. Opt., 26, 1987, 4274.
-
(1987)
Appl. Opt.
, vol.26
, pp. 4274
-
-
Strand, T.C.1
Katzir, Y.2
-
204
-
-
0020919219
-
-
Takeda, M., Mutoh, K., Appl. Opt., 22, 1983, 3977.
-
(1983)
Appl. Opt.
, vol.22
, pp. 3977
-
-
Takeda, M.1
Mutoh, K.2
-
205
-
-
0019927495
-
-
Takeda, M., Ina, H., Kobayashi, S., J. Opt. Soc. Am., 72, 1982, 156.
-
(1982)
J. Opt. Soc. Am.
, vol.72
, pp. 156
-
-
Takeda, M.1
Ina, H.2
Kobayashi, S.3
-
207
-
-
85012613500
-
-
Thalmann, R., Daendliker, R., Appl. Opt., 26, 1987, 475.
-
(1987)
Appl. Opt.
, vol.26
, pp. 475
-
-
Thalmann, R.1
Daendliker, R.2
-
209
-
-
0003491390
-
-
2nd Ed. McGraw-Hill Book Co. New York, Toronto, London
-
Timoshenko, S., Woinowsky-Krieger, S., Theory of Plates and Shells, 2nd Ed., 1959, McGraw-Hill Book Co., New York, Toronto, London.
-
(1959)
Theory of Plates and Shells
-
-
Timoshenko, S.1
Woinowsky-Krieger, S.2
-
216
-
-
0042033592
-
-
Wenke, L., Schreiber, W., Erler, K., Feingeratetechnik, 29, 1980, 413.
-
(1980)
Feingeratetechnik
, vol.29
, pp. 413
-
-
Wenke, L.1
Schreiber, W.2
Erler, K.3
-
220
-
-
1842343988
-
-
Womack, K.H., Jonas, J.A., Koliopoulos, C.L., Underwood, K.L., Wyant, J.C., Loomis, J.S., Hayslett, C.R., Proc. SPIE, 192, 1979, 134.
-
(1979)
Proc. SPIE
, vol.192
, pp. 134
-
-
Womack, K.H.1
Jonas, J.A.2
Koliopoulos, C.L.3
Underwood, K.L.4
Wyant, J.C.5
Loomis, J.S.6
Hayslett, C.R.7
-
226
-
-
0022497531
-
-
Wyant, J.C., Koliopoulos, C.L., Bhushan, B., Basila, D., J. Trib., 108, 1986, 1.
-
(1986)
J. Trib.
, vol.108
, pp. 1
-
-
Wyant, J.C.1
Koliopoulos, C.L.2
Bhushan, B.3
Basila, D.4
-
227
-
-
85012736406
-
-
Information Sheet by Wyko Corp.
-
Wyko 1986 Digital Interferometer Systems, Information Sheet by Wyko Corp.
-
(1986)
Digital Interferometer Systems
-
-
-
230
-
-
0003129935
-
-
Yatagai, T., Idesawa, M., Opt. & Laser Eng., 3, 1982, 73.
-
(1982)
Opt. & Laser Eng.
, vol.3
, pp. 73
-
-
Yatagai, T.1
Idesawa, M.2
-
231
-
-
0020870509
-
-
Yatagai, T., Kanou, T., Proc. SPIE, 429, 1983, 136.
-
(1983)
Proc. SPIE
, vol.429
, pp. 136
-
-
Yatagai, T.1
Kanou, T.2
-
232
-
-
85012708164
-
-
Yatagai, T., Idesawa, M., Saito, S., Proc. SPIE, 316, 1981, 81.
-
(1981)
Proc. SPIE
, vol.316
, pp. 81
-
-
Yatagai, T.1
Idesawa, M.2
Saito, S.3
-
233
-
-
0020180303
-
-
Yatagai, T., Idesawa, M., Yamaashi, Y., Suzuki, M., Opt. Eng., 21, 1982, 901.
-
(1982)
Opt. Eng.
, vol.21
, pp. 901
-
-
Yatagai, T.1
Idesawa, M.2
Yamaashi, Y.3
Suzuki, M.4
-
234
-
-
0020136703
-
-
Yatagai, T., Nakadate, S., Idesawa, M., Saito, H., Opt. Eng., 21, 1982, 432.
-
(1982)
Opt. Eng.
, vol.21
, pp. 432
-
-
Yatagai, T.1
Nakadate, S.2
Idesawa, M.3
Saito, H.4
-
235
-
-
0021469148
-
-
Yatagai, T., Inaba, S., Nakano, H., Suzuki, M., Opt. Eng., 23, 1984, 401.
-
(1984)
Opt. Eng.
, vol.23
, pp. 401
-
-
Yatagai, T.1
Inaba, S.2
Nakano, H.3
Suzuki, M.4
-
236
-
-
84975568072
-
-
Yoshizumi, K., Murao, T., Masui, J., Imanaka, R., Okino, Y., Appl. Opt., 26, 1987, 1647.
-
(1987)
Appl. Opt.
, vol.26
, pp. 1647
-
-
Yoshizumi, K.1
Murao, T.2
Masui, J.3
Imanaka, R.4
Okino, Y.5
-
237
-
-
0006524672
-
-
Zeevi, Y.Y., Gavriely, A., Shamai, S., J. Opt. Soc. Am. A, 4, 1987, 2045.
-
(1987)
J. Opt. Soc. Am. A
, vol.4
, pp. 2045
-
-
Zeevi, Y.Y.1
Gavriely, A.2
Shamai, S.3
-
238
-
-
85012601451
-
-
Mark IV Interferometer System, Information Sheet by Zygo Corp.
-
Zygo 1988 Mark IV Interferometer System, Information Sheet by Zygo Corp.
-
(1988)
-
-
|