A bayesian algorithm for sample size determination for equivalence and non-inferiority test

Journal of Applied Statistics

Volumn 37, Issue 10, 2010, Pages 1749-1759

  Wang, Jie ^a   Stamey, James D ^b  

^a IQVIA   (United States)

^b BAYLOR UNIVERSITY   (United States)

Author keywords

Average coverage criterion; Average length criterion; Average posterior variance criteria; Equivalence test; Non inferiority test; Sample size determination

Indexed keywords

EID: 77956956154     PISSN: 02664763     EISSN: 13600532     Source Type: Journal    
DOI: 10.1080/02664760903150714     Document Type: Article

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